Search

Now showing items 1-4 of 4

Characterization of in-IC integrable in-plane nanometer scale resonators fabricated by a silicon on nothing advanced CMOS technology

Durand, C.; Casset, F.; Legrand, Bernard; et al.
21st IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2008, 2008, Proceedings of the 21st IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2008, IEEE, Piscataway, NJ, USA, 2008

Communication dans un congrès avec actesAutre communication scientifique (congrès sans actes - poster - séminaire...)fulltext
In-plane silicon-on-nothing nanometer-scale resonant suspended gate MOSFET for in-IC integration perspectives

Durand, C.; Casset, F.; Renaux, P.; et al.
IEEE Electron Device Letters, Institute of Electrical and Electronics Engineers, 2008, 29, 494-496

Article dans une revue scientifiquefulltext
Ultra-sensitive capacitive detection based on SGMOSFET compatible with front-end CMOS process

Colinet, E.; Durand, C.; Duraffourg, L.; et al.
IEEE Journal of Solid-State Circuits, Institute of Electrical and Electronics Engineers, 2009, 44, 247-257

Compte-rendu et recension critique d'ouvrage
Dynamic Optical Characterization of NEMS Resonators

Coudron, Loïc; Casset, Fabrice; Durand, C.; et al.
SiRF 2008. IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, Orlando, 23-01-2008, Silicon Monolithic Integrated Circuits in RF Systems, 2008, 01-02-2008

Communication dans un congrès avec actes