Parcourir Liste des unités par auteur "Bychikhin, S."
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Current conduction and saturation mechanism in AlGaN/GaN ungated structures
Kuzmik, J.; Bychikhin, S.; Pogany, D.; et al.Journal of Applied Physics, American Institute of Physics, 2006, 99, 123720-1-7Compte-rendu et recension critique d'ouvragetexte intégral -
Influence of surface trapping on determination of electron saturation velocity in AlGaN/GaN heterostructure
Kuzmik, J.; Bychikhin, S.; Pichonat, Emmanuelle; et al.28th International Conference of the Physics of Semiconductors, Vienne, 07-2006Autre communication scientifique (congrès sans actes - poster - séminaire...) -
Investigation of the thermal boundary resistance at the III-Nitride/substrate interface using optical methods
Kuzmik, J.; Bychikhin, S.; Pogany, D.; et al.American Institute of Physics, 2007Autre communication scientifique (congrès sans actes - poster - séminaire...) -
Investigation of the thermal boundary resistance at the III-nitride/substrate interface using optical methods
Kuzmik, J.; Bychikhin, S.; Pogany, D.; et al.Journal of Applied Physics, American Institute of Physics, 2007, 101, 054508-1-6Compte-rendu et recension critique d'ouvragetexte intégral -
Self-heating phenomena in high-power III-N transistors and new thermal characterization methods developed within EU project TARGET
Kuzmik, J.; Bychikhin, S.; Pichonat, Emmanuelle; et al.International Journal of Microwave and Wireless Technologies, Cambridge University Press/European Microwave Association, 2009, 1, 153-160Compte-rendu et recension critique d'ouvrage -
Self-heating phenomena in high-power III-N transistors and new thermal characterization methods developed within EU project TARGET
Kuzmik, J.; Bychikhin, S.; Pichonat, Emmanuelle; et al.International Journal of Microwave and Wireless Technologies, Cambridge University Press/European Microwave Association, 2009, 1, 153 - 160Compte-rendu et recension critique d'ouvrage -
Temperature analysis of AlGaN/GaN high-electron-mobility transistors using micro-Raman scaterring spectroscopy and transient interferometric mapping
Pichonat, Emmanuelle; Kuzmik, J.; Bychikhin, S.; et al.Proceedings of the first European Microwave Integrated Circuits Conference, Manchester, 09-2006Autre communication scientifique (congrès sans actes - poster - séminaire...) -
Temperature analysis of AlGaN/GaN high-electron-mobility transistors using micro-Raman scattering spectroscopy and transient interferometric mapping
Pichonat, Emmanuelle; Kuzmik, J.; Bychikhin, S.; et al.1st European Microwave Integrated Circuits Conference, EuMIC 2006, 2006, Proceedings of the 2006 1st European Microwave Integrated Circuits Conference, EuMIC 2006, IEEE, Piscataway, NJ, USA, 2006Communication dans un congrès avec actes -
Thermal characterization of HF power FETS
Pogany, D.; Kuzmik, J.; Bychikhin, S.; et al.Target days, Frascati, 10-2006Autre communication scientifique (congrès sans actes - poster - séminaire...) -
Transient self-heating effects in multifinger AlGaN/GaN HEMTs, with metal airbridges
Kuzmik, J.; Bychikhin, S.; Lossy, R.; et al.Solid-State Electronics, Elsevier, 2007, 51, 969-974Compte-rendu et recension critique d'ouvragetexte intégral