Title :

Synthesis and electrical properties of lead-free piezoelectric Bi 0.5 Na 0.5 TiO 3 thin films prepared by Sol-Gel method

Author(s) :

Dargham, S. Abou [Auteur]
Ponchel, Freddy [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Abboud, N. [Auteur]
Soueidan, M. [Auteur]
Ferri, Anthony [Auteur]
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Desfeux, Rachel [Auteur]
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Assaad, Jamal [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Remiens, Denis [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Zaouk, D. [Auteur]

Journal title :

Journal of the European Ceramic Society

Volume number :

38

Pages :

1450-1455

Publisher :

Elsevier

Publication date :

2018-04

English keyword(s) :

Piezoelectric
Lead-Free
Sol-Gel
Thin films
BNT

HAL domain(s) :

Chimie/Chimie inorganique

English abstract : [en]

Lead-free Bi0.5Na0.5TiO3 (BNT) piezoelectric thin films were deposited on Pt/TiOx/SiO2/Si substrates by Sol-Gel method. A dense and well crystallized thin film with a perovskite phase was obtained by annealing the film at ...
Show more >Lead-free Bi0.5Na0.5TiO3 (BNT) piezoelectric thin films were deposited on Pt/TiOx/SiO2/Si substrates by Sol-Gel method. A dense and well crystallized thin film with a perovskite phase was obtained by annealing the film at 700 °C in a rapid thermal processing system. The relative dielectric constant and loss tangent at 12 kHz, of BNT thin film with 350 nm thickness, were 425 and 0.07, respectively. Ferroelectric hysteresis measurements indicated a remnant polarization value of 9 μC/cm2 and a coercive field of 90 kV/cm. Piezoelectric measurements at the macroscopic level were also performed: a piezoelectric coefficient (d33effmax) of 47 pm/V at E = 190 kV/cm was obtained. The piezoresponse force microscopy data confirmed that BNT thin films present ferroelectric and piezoelectric behavior at the nanoscale level.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Administrative institution(s) :

ISEN
Univ. Valenciennes
ENSCL
CNRS
Institut Catholique Lille
Centrale Lille
Univ. Artois
Université de Lille

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520
• Unité de Catalyse et Chimie du Solide (UCCS) - UMR 8181

Research team(s) :

Couches minces & nanomatériaux (CMNM)

Submission date :

2019-09-25T14:37:47Z
2021-03-12T13:39:36Z