Title :

Test Case Purification for Improving Fault Localization

Author(s) :

Xuan, Jifeng [Auteur]
Self-adaptation for distributed services and large software systems [SPIRALS]
Monperrus, Martin [Auteur]
Self-adaptation for distributed services and large software systems [SPIRALS]
Université de Lille

Conference title :

FSE - 22nd ACM SIGSOFT International Symposium on the Foundations of Software Engineering

City :

Hong Kong

Country :

Chine

Start date of the conference :

2014-11-16

Publication date :

2014-11-16

English keyword(s) :

Test case purification
spectrum-based fault localization
test case atomization
dynamic program slicing

HAL domain(s) :

Informatique [cs]/Génie logiciel [cs.SE]

English abstract : [en]

Finding and fixing bugs are time-consuming activities in software development. Spectrum-based fault localization aims to identify the faulty position in source code based on the execution trace of test cases. Failing test ...
Show more >Finding and fixing bugs are time-consuming activities in software development. Spectrum-based fault localization aims to identify the faulty position in source code based on the execution trace of test cases. Failing test cases and their assertions form test oracles for the failing behavior of the system under analysis. In this paper, we propose a novel concept of spectrum driven test case purification for improving fault localization. The goal of test case purification is to separate existing test cases into small fractions (called purified test cases) and to enhance the test oracles to further localize faults. Combining with an original fault localization technique (e.g., Tarantula), test case purification results in better ranking the program statements. Our experiments on 1800 faults in six open-source Java programs show that test case purification can effectively improve existing fault localization techniques.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Centre de Recherche en Informatique, Signal et Automatique de Lille (CRIStAL) - UMR 9189

Source :

Harvested from HAL