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Fault Tolerance Analysis for Stochastic ...
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Document type :
Compte-rendu et recension critique d'ouvrage
Title :
Fault Tolerance Analysis for Stochastic Systems Using Switching Diffusion Processes
Author(s) :
Yang, Hao [Auteur]
Jiang, Bin [Auteur]
Cocquempot, Vincent [Auteur] refId
Systèmes Tolérants aux Fautes [STF]
Journal title :
International Journal of Control
Pages :
1516-1525
Publisher :
Taylor & Francis
Publication date :
2009-08-01
ISSN :
0020-7179
English keyword(s) :
Lyapunov function
Rate function
Modeling
regime switching model
Statistical analysis
Diffusion process
Fault diagnostic
Production system
Fault tolerant system
Control synthesis
Input to state stability
Uncertain system
Multimodel control
Non deterministic system
Fault tolerance
HAL domain(s) :
Sciences de l'ingénieur [physics]/Automatique / Robotique
English abstract : [en]
This article models a class of stochastic systems with faults by switching diffusion processes (SDP), and analyses the fault tolerability of such stochastic systems in the sense of input-to-state stability of overall SDP. ...
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This article models a class of stochastic systems with faults by switching diffusion processes (SDP), and analyses the fault tolerability of such stochastic systems in the sense of input-to-state stability of overall SDP. The fault tolerability relies on the trade-off among the fault occurrence transition rate, the frequency of switching, and the decreasing rate of Lyapunov functions along the solution of the system. Our results show that it may not be necessary to design the fault tolerant controller even though the stochastic system is not separately stable in the healthy and faulty situations, the stability of the overall system process is still guaranteed under some conditions. The proposed tools are illustrated through an example of a fault-prone manufacturing system.Show less >
Language :
Anglais
Popular science :
Non
Collections :
  • Centre de Recherche en Informatique, Signal et Automatique de Lille (CRIStAL) - UMR 9189
Source :
Harvested from HAL
Université de Lille

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