Title :

Sensor fault diagnosis for bilinear systems using data-based residuals

Author(s) :

Hakem, Assia [Auteur]
Laboratoire d'Automatique, Génie Informatique et Signal [LAGIS]
Pekpe, Midzodzi [Auteur]
Systèmes Tolérants aux Fautes [STF]
Cocquempot, Vincent [Auteur]
Systèmes Tolérants aux Fautes [STF]

Conference title :

50th IEEE Conference on Decision and Control and European Control Conference : IEEE CDC/ECC 2011

City :

Orlando

Country :

Etats-Unis d'Amérique

Start date of the conference :

2011-12-12

Book title :

Decision and Control and European Control Conference (CDC-ECC), 2011 50th IEEE Conference on

Publication date :

2011-12-12

English keyword(s) :

Data driven methods
activated sludge process
bilinear systems

HAL domain(s) :

Sciences de l'ingénieur [physics]/Automatique / Robotique

English abstract : [en]

The proposed data-based FDI method has the advantage to require only available data: control signals and measured outputs. The unique information that we have about the system is its structure but the parameters values are ...
Show more >The proposed data-based FDI method has the advantage to require only available data: control signals and measured outputs. The unique information that we have about the system is its structure but the parameters values are supposed to be unknown. This data-based residual method was described, by the same authors in previous publication, for linear systems. In this paper we apply this method to bilinear structure models. A particular focus is made on computational complexity reduction. It will be shown that a part of the system dynamics may be neglected with the consequence to simplify the on-line residual computation. This method is illustrated on a simulated Activated Sludge Process.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Centre de Recherche en Informatique, Signal et Automatique de Lille (CRIStAL) - UMR 9189

Source :

Harvested from HAL