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Flexible GHz transistors derived from solution-based single-layer graphene
Nano Letters, American Chemical Society, 2012, 12, 1184-1188Compte-rendu et recension critique d'ouvrage -
Design and fabrication of nanometer measurement platform for better understanding of silicon mechanical properties
Journal of Applied Physics, American Institute of Physics, 2023, 134; 2, 024305Compte-rendu et recension critique d'ouvragetexte intégral -
Imaging of THz photonic modes by scattering scanning near-field optical microscopy
ACS Applied Materials & Interfaces, Washington, D.C. : American Chemical Society, 20-07-2022, 14; 28, 32608-32617Compte-rendu et recension critique d'ouvragetexte intégral -
High efficiency UTC photodiode for high spectral efficiency THz links
2017 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Cancun, 27-08-2017, IEEECommunication dans un congrès avec actes -
Iuliacumite: A Novel Chemical Short-Range Order in a Two-Dimensional Wurtzite Single Monolayer InAs 1– x Sb x Shell on InAs Nanowires
Nano Letters, American Chemical Society, 12-2019, 19; 12, 8801-8805Compte-rendu et recension critique d'ouvragetexte intégral -
Sensitivity and Accuracy Analysis in Scanning Microwave Microscopy
IEEE MTT-S International Microwave Symposium, IMS 2016, San Francisco, CA, 22-05-2016, Proceedings of 2016 IEEE MTT International Microwave Symposium, IMS 2016, 2016Communication dans un congrès avec actes -
Operation of near-field scanning millimeter-wave microscopy up to 67 GHz under scanning electron microscopy vision
IEEE MTT International Microwave Symposium, IMS 2020, Los Angeles (On-line event), 21-06-2020, Proceedings of IEEE/MTT-S International Microwave Symposium, IMS 2020, Proceedings of IEEE/MTT-S International Microwave Symposium, IMS 2020, 06-2020Communication dans un congrès avec actestexte intégral -
Development of a reference wafer for on-wafer testing of extreme impedance devices
88th ARFTG Microwave Measurement Symposium, ARFTG 2016, Austin, 06-12-2016, Proceedings of 88th ARFTG Microwave Measurement Symposium, ARFTG 2016, 2016Communication dans un congrès avec actestexte intégral -
Multimodal imaging technology by integrated scanning electron, force, and microwave microscopy and its application to study microscaled capacitors
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, AVS through the American Institute of Physics, 2018, 36; 2, 022901Compte-rendu et recension critique d'ouvragetexte intégral -
Setting parameters influence on accuracy and stability of near-field scanning microwave microscopy platform
IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 04-2016, 65; 4, 890-897Compte-rendu et recension critique d'ouvrage