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Design and fabrication of nanometer measurement platform for better understanding of silicon mechanical properties
Journal of Applied Physics, American Institute of Physics, 2023, 134; 2, 024305Compte-rendu et recension critique d'ouvragetexte intégral -
Imaging of THz photonic modes by scattering scanning near-field optical microscopy
ACS Applied Materials & Interfaces, Washington, D.C. : American Chemical Society, 20-07-2022, 14; 28, 32608-32617Compte-rendu et recension critique d'ouvragetexte intégral -
Iuliacumite: A Novel Chemical Short-Range Order in a Two-Dimensional Wurtzite Single Monolayer InAs 1– x Sb x Shell on InAs Nanowires
Nano Letters, American Chemical Society, 12-2019, 19; 12, 8801-8805Compte-rendu et recension critique d'ouvragetexte intégral -
Operation of near-field scanning millimeter-wave microscopy up to 67 GHz under scanning electron microscopy vision
IEEE MTT International Microwave Symposium, IMS 2020, Los Angeles (On-line event), 21-06-2020, Proceedings of IEEE/MTT-S International Microwave Symposium, IMS 2020, Proceedings of IEEE/MTT-S International Microwave Symposium, IMS 2020, 06-2020Communication dans un congrès avec actestexte intégral -
Development of a reference wafer for on-wafer testing of extreme impedance devices
88th ARFTG Microwave Measurement Symposium, ARFTG 2016, Austin, 06-12-2016, Proceedings of 88th ARFTG Microwave Measurement Symposium, ARFTG 2016, 2016Communication dans un congrès avec actestexte intégral -
Multimodal imaging technology by integrated scanning electron, force, and microwave microscopy and its application to study microscaled capacitors
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, AVS through the American Institute of Physics, 2018, 36; 2, 022901Compte-rendu et recension critique d'ouvragetexte intégral -
Microwave interferometry based on open-ended coaxial technique for high sensitivity liquid sensing
Advanced Electromagnetics, Advanced Electromagnetics, 21-10-2017, 6; 3, 88-93Compte-rendu et recension critique d'ouvragetexte intégral -
A Comparative Investigation of Plasmonic Properties between Tunable Nanoobjects and Metallized Nanoprobes for Optical Spectroscopy
Journal of Physical Chemistry C, American Chemical Society, 2019, 123; 46, 28392–28400Compte-rendu et recension critique d'ouvragetexte intégral -
Noise performance of frequency modulation Kelvin force microscopy
Beilstein Journal of Nanotechnology, Karlsruhe Institute of Technology., 2014, 5, 1-18Compte-rendu et recension critique d'ouvragetexte intégral -
Sub-fF 130 nm MOS Varactor Characterization using 6 . 8 GHz Interferometry-based Reflectometer
IEEE Microwave and Wireless Components Letters, Institute of Electrical and Electronics Engineers, 06-05-2015, 25; 6, 418 - 420Compte-rendu et recension critique d'ouvragetexte intégral