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Sensitivity and Accuracy Analysis in Scanning Microwave Microscopy
IEEE MTT-S International Microwave Symposium, IMS 2016, San Francisco, CA, 22-05-2016, Proceedings of 2016 IEEE MTT International Microwave Symposium, IMS 2016, 2016Communication dans un congrès avec actes -
Operation of near-field scanning millimeter-wave microscopy up to 67 GHz under scanning electron microscopy vision
IEEE MTT International Microwave Symposium, IMS 2020, Los Angeles (On-line event), 21-06-2020, Proceedings of IEEE/MTT-S International Microwave Symposium, IMS 2020, Proceedings of IEEE/MTT-S International Microwave Symposium, IMS 2020, 06-2020Communication dans un congrès avec actestexte intégral -
Development of a reference wafer for on-wafer testing of extreme impedance devices
88th ARFTG Microwave Measurement Symposium, ARFTG 2016, Austin, 06-12-2016, Proceedings of 88th ARFTG Microwave Measurement Symposium, ARFTG 2016, 2016Communication dans un congrès avec actestexte intégral -
Setting parameters influence on accuracy and stability of near-field scanning microwave microscopy platform
IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 04-2016, 65; 4, 890-897Compte-rendu et recension critique d'ouvrage -
Modeling and calibration in near-field microwave microscopy for dielectric constant and loss tangent measurement
IEEE Sensors Journal, Institute of Electrical and Electronics Engineers, 15-06-2016, 16; 12, 4667-4668Compte-rendu et recension critique d'ouvrage -
Microwave interferometry based on open-ended coaxial technique for high sensitivity liquid sensing
Advanced Electromagnetics, Advanced Electromagnetics, 21-10-2017, 6; 3, 88-93Compte-rendu et recension critique d'ouvragetexte intégral -
Near-Field Scanning Millimeter-wave Microscope Combined with a Scanning Electron Microscope
IEEE-Microwave-Theory-and-Techniques-Society International Microwave Symposium, IMS 2017, Honolulu, HI, 04-06-2017, Proceedings of 60th IEEE MTT-S International Microwave Symposium, IMS 2017, 2017Communication dans un congrès avec actes -
Miniaturized Microcantilever-based RF Microwave Probes Using MEMS Technologies
Procedia Engineering, Elsevier, 2014, 87, 692-695Compte-rendu et recension critique d'ouvragetexte intégral -
Near-field scanning millimeter-wave microscope operating inside a scanning electron microscope: towards quantitative electrical nanocharacterization
Applied Sciences, Multidisciplinary digital publishing institute (MDPI), 2021, 11; 6, 2788Compte-rendu et recension critique d'ouvragetexte intégral -
Quantitative Error Analysis in Near-Field Scanning Microwave Microscopy
2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), Nagoya, 04-07-2018, 2018 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS), IEEECommunication dans un congrès avec actestexte intégral