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Sensitivity and Accuracy Analysis in Scanning Microwave Microscopy
IEEE MTT-S International Microwave Symposium, IMS 2016, San Francisco, CA, 22-05-2016, Proceedings of 2016 IEEE MTT International Microwave Symposium, IMS 2016, 2016Communication dans un congrès avec actes -
Development of a reference wafer for on-wafer testing of extreme impedance devices
88th ARFTG Microwave Measurement Symposium, ARFTG 2016, Austin, 06-12-2016, Proceedings of 88th ARFTG Microwave Measurement Symposium, ARFTG 2016, 2016Communication dans un congrès avec actestexte intégral -
Setting parameters influence on accuracy and stability of near-field scanning microwave microscopy platform
IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers, 04-2016, 65; 4, 890-897Compte-rendu et recension critique d'ouvrage -
Modeling and calibration in near-field microwave microscopy for dielectric constant and loss tangent measurement
IEEE Sensors Journal, Institute of Electrical and Electronics Engineers, 15-06-2016, 16; 12, 4667-4668Compte-rendu et recension critique d'ouvrage -
Small-Signal Characterization and Modeling of 55 nm SiGe BiCMOS HBT up to 325 GHz
Solid-State Electronics, Elsevier, 22-11-2016Compte-rendu et recension critique d'ouvrage -
Lazarevicite-type short-range ordering in ternary III-V nanowires
Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 14-11-2016, 94; 19, 195306Compte-rendu et recension critique d'ouvragetexte intégral -
Millimeter-wave six-port IQ demodulator in 65 nm SOI CMOS technology
30th International Instrumentation and Meausurement Technology Conference, IEEE I2MTC 2016, Taipei, 23-05-2016, Proceedings of 30th International Instrumentation and Meausurement Technology Conference, IEEE I2MTC 2016, 2016Communication dans un congrès avec actes -
Length dependence of thermal conductivity by approach-to-equilibrium molecular dynamics
Physical Review B, American Physical Society, 2016, 94; 5, 054304Compte-rendu et recension critique d'ouvragetexte intégral