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Fabrication, characterization, and physical analysis of AlGaN/GaN HEMTs on flexible substrates
IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2013, 60, 1054-1059Compte-rendu et recension critique d'ouvrage -
RF performance of InAlN/AlN/GaN HEMTs on sapphire substrate
Electronics Letters, IET, 2011, 47, 212-214Compte-rendu et recension critique d'ouvrage -
The effect of gate length variation on InAlGaN/GaN HFET device characteristics
Semiconductor Science and Technology, IOP Publishing, 2012, 27, 035009-1-4Compte-rendu et recension critique d'ouvragetexte intégral -
Optimization of Al0.29Ga0.71N/GaN high electron mobility heterostructures for high-power/frequency performances
IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2013, 60, 3105-3111Compte-rendu et recension critique d'ouvrage -
InAlN/GaN HEMTs on sapphire substrate with 2.9-W/mm output power density at 18 GHz
IEEE Electron Device Letters, Institute of Electrical and Electronics Engineers, 2011, 32, 1537-1539Compte-rendu et recension critique d'ouvrage -
Thermal resistance of AlGaN/GaN HEMTs on SopSiC composite substrate
Electronics Letters, IET, 2010, 46, 949-950Compte-rendu et recension critique d'ouvrage -
Low microwave noise of AlGaN/GaN HEMTs fabricated on SiCopSiC substrates
Electronics Letters, IET, 2010, 46, 84-85Compte-rendu et recension critique d'ouvrage -
A 4-fJ/spike artificial neuron in 65 nm CMOS technology
Frontiers in Neuroscience, Frontiers, 2017, 11, 123Compte-rendu et recension critique d'ouvragetexte intégral -
AlGaN/GaN HEMTs on a (001)-oriented silicon substrate based on 100-nm SiN recessed gate technology for microwave power amplification
IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers, 2007, 54, 2843-2848Compte-rendu et recension critique d'ouvrage -
The indium content in metamorphic InAlAs/InGaAs HEMTs on GaAs substrate : a new structure parameter
Solid-State Electronics, Elsevier, 2000, 44, 1021-1027Compte-rendu et recension critique d'ouvrage