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Integrated MEMS RF Probe for SEM Station—Pad Size and Parasitic Capacitance Reduction
IEEE Microwave and Wireless Components Letters, Institute of Electrical and Electronics Engineers, 10-2015, 25; 10, 693-695Compte-rendu et recension critique d'ouvrage -
Control and automation for miniaturized microwave GSG nanoprobing
Machine Vision and Navigation, Springer International Publishing, 01-10-2020Partie d'ouvragetexte intégral -
Composition modulation by twinning in InAsSb nanowires Composition modulation by twinning in InAsSb nanowires
Nanotechnology, Institute of Physics, 05-2019, 30; 32Compte-rendu et recension critique d'ouvrage -
Influence of doping level and surface states in tunneling spectroscopy of an In<sub>0.53</sub>Ga<sub>0.47</sub>As quantum well grown on p-type doped InP(001)
Physical Review Materials, American Physical Society, 20-09-2019, 3; 9Compte-rendu et recension critique d'ouvragetexte intégral -
Exploring the capabilities of scanning microwave microscopy to characterize semiconducting polymers
Applied Sciences, Multidisciplinary digital publishing institute (MDPI), 20-11-2020, 10; 22, 8234, 11 pagesCompte-rendu et recension critique d'ouvragetexte intégral -
Quantitative determination of small dielectric and loss tangent contrasts in liquids
IEEE International Instrumentation and Meausurement Technology Conference, IEEE I2MTC 2017, Torino, 22-05-2017, Proceedings of 2017 IEEE International Instrumentation and Meausurement Technology Conference, IEEE I2MTC 2017, 2017Communication dans un congrès avec actes -
Combined scanning microwave and electron microscopy: a novel toolbox for hybrid nanoscale material analysis[Invited]
IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes, IMWS-AMP 2017, Pavia, 20-09-2017, Proceedings of 2017 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes, IMWS-AMP 2017, 2017Communication dans un congrès avec actes -
Measurement Accuracy and Repeatability in Near-Field Scanning Microwave Microscopy
IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015, Pisa, 11-05-2015, 2015 -
Millimeter-wave six-port IQ demodulator in 65 nm SOI CMOS technology
30th International Instrumentation and Meausurement Technology Conference, IEEE I2MTC 2016, Taipei, 23-05-2016, Proceedings of 30th International Instrumentation and Meausurement Technology Conference, IEEE I2MTC 2016, 2016Communication dans un congrès avec actes -
Caractérisation hyperfréquence sous pointes de nano dispositifs: métrologie et instrumentation
Université de Lille, 20-12-2018Thèse