1-20 GHz k Omega-range BiCMOS 55 nm Reflectometer

Ferreira, Pietro M.; Donche, Cora; Haddadi, Kamel; Lasri, Tuami; Dambrine, Gilles; Gaquière, Christophe; Quemerais, Thomas; Gloria, Daniel

Document type :

Autre communication scientifique (congrès sans actes - poster - séminaire...): Communication dans un congrès avec actes

Title :

1-20 GHz k Omega-range BiCMOS 55 nm Reflectometer

Author(s) :

Ferreira, Pietro M. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Donche, Cora [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Haddadi, Kamel [Auteur]

Circuits Systèmes Applications des Micro-ondes - IEMN [CSAM - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Lasri, Tuami [Auteur]
Microtechnology and Instrumentation for Thermal and Electromagnetic Characterization - IEMN [MITEC - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Dambrine, Gilles [Auteur]

Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Gaquière, Christophe [Auteur]
Puissance - IEMN [PUISSANCE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Quemerais, Thomas [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Gloria, Daniel [Auteur]
STMicroelectronics

Conference title :

12th IEEE International New Circuits and Systems Conference (IEEE NEWCAS)

City :

Trois-Rivieres

Country :

Canada

Start date of the conference :

2014-06-22

Publication date :

2014

HAL domain(s) :

Sciences de l'ingénieur [physics]

English abstract : [en]

Scanning microwave microscope (SMM) combines the high spatial resolution with the high-sensitivity electric measurement capabilities of a vector network analyzer (VNA). SMM has been pointed out as very well suited for ...
Show more >Scanning microwave microscope (SMM) combines the high spatial resolution with the high-sensitivity electric measurement capabilities of a vector network analyzer (VNA). SMM has been pointed out as very well suited for nanodevices characterization. In recent publications, SMM has demonstrated high performance while measuring kO-range impedances at low microwave frequency range (1-20 GHz). In spite of exceptional results, interferometry-based systems are so far hardly feasible as an integrated circuit due to physical constraints. In this work, an innovative design of integrated reflectometer based on BiCMOS 55 nm technology from STMicroelectronics is proposed. Electrical simulation results have proved a linear tuner calibration from 0.9 to 1.4 fF with an 8-bits precision (i.e. 2.0 aF). Reflectometer performance has been considered under influence of temperature variation from -55 to 125 degrees C and process variability. Such results demonstrate a slight influence of temperature variation and process variability in the reflectometer calibration which is negligible for SMM applications.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL

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