Title :

Noise characterization of patch antenna THz photodetectors

Author(s) :

Palaferri, D. [Auteur]
Todorov, Y. [Auteur]
Gacemi, D. [Auteur]
Laboratoire Pierre Aigrain [LPA]
Barbieri, S [Auteur]
Photonique THz - IEMN [PHOTONIQUE THz - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Li, L. [Auteur]
Davies, A. [Auteur]
Linfield, E. [Auteur]
University of Leeds
Sirtori, C. [Auteur]
Thales Research and Technology [Palaiseau]

Journal title :

Applied Physics Letters

Pages :

161105

Publisher :

American Institute of Physics

Publication date :

2018-10-15

ISSN :

0003-6951

English keyword(s) :

Photodetectors
Quantum wells
Terahertz detectors
Electric currents
Electrical properties and parameters
Electronic noise
Antennas
Signal processing
Microoptics
Photoconductive materials

HAL domain(s) :

Sciences de l'ingénieur [physics]/Optique / photonique

English abstract : [en]

Current noise fluctuations have been investigated in terahertz (THz) quantum well photodetectors embedded in antenna-coupled photonic architectures and compared with standard substrate-coupled mesa detectors. The noise ...
Show more >Current noise fluctuations have been investigated in terahertz (THz) quantum well photodetectors embedded in antenna-coupled photonic architectures and compared with standard substrate-coupled mesa detectors. The noise measurements give a value of the photoconductive gain that is in excellent agreement with that extracted from previous responsivity calibrations. Moreover, our results confirm that the noise equivalent power (NEP) of the antenna-coupled devices is of the order of 0.2 pW/Hz0.5. This low NEP value and the wide band frequency response (∼GHz) of the detectors are ideal figures for the development of heterodyne receivers that are, at present, a valuable technological solution to overcome the current limitation of THz sensors.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

ANR Project :

Detecteurs infrarouges à ultra-bas courant d'obscurité intégrés aux méta-materiaux

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL