Title :

Blind digital modulation identification for spatially-correlated MIMO systems

Author(s) :

Hassan, Kais [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Dayoub, Iyad [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Hamouda, Walaa [Auteur]
Concordia University [Montreal]
Nsiala-Nzéza, Crépin [Auteur]
Laboratoire Electronique, Ondes et Signaux pour les Transports [INRETS/LEOST]
Berbineau, Marion [Auteur]
Laboratoire Electronique, Ondes et Signaux pour les Transports [INRETS/LEOST]

Journal title :

IEEE Transactions on Wireless Communications

Pages :

683-693

Publisher :

Institute of Electrical and Electronics Engineers

Publication date :

2012

ISSN :

1536-1276

English keyword(s) :

Modulation
MIMO
Feature extraction
Vectors
Correlation
Signal processing algorithms
Signal to noise ratio

HAL domain(s) :

Sciences de l'ingénieur [physics]

English abstract : [en]

Modulation type is one of the most important characteristics used in signal waveform identification and classification. Spatial correlation is a crucial factor for practical multiple-input multiple-output (MIMO) systems. ...
Show more >Modulation type is one of the most important characteristics used in signal waveform identification and classification. Spatial correlation is a crucial factor for practical multiple-input multiple-output (MIMO) systems. This paper addresses the problem of blind digital modulation identification in spatially-correlated MIMO systems. The proposed algorithm is verified using higher order statistical moments and cumulants of the received signal. The purpose is to discriminate among different M-ary shift keying linear modulation schemes without any priori signal information. This study employs several MIMO techniques to identify the modulation with and without channel state information (CSI). The proposed classifier shows a high identification performance in acceptable signal-to-noise ratio (SNR) range.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL