Investigation of the carbon nanotube AFM tip contacts: free sliding versus pinned contact

Buchoux, Julien; Aimé, Jean-Pierre; Boisgard, Rodolphe; Nguyen, Cattien V; Buchaillot, Lionel; Marsaudon, Sophie

Document type :

Article dans une revue scientifique

DOI :

10.1088/0957-4484/20/47/475701

Title :

Investigation of the carbon nanotube AFM tip contacts: free sliding versus pinned contact

Author(s) :

Buchoux, Julien [Auteur]
Centre de physique moléculaire optique et hertzienne [CPMOH]
Aimé, Jean-Pierre [Auteur]
Centre de physique moléculaire optique et hertzienne [CPMOH]
Boisgard, Rodolphe [Auteur]
Centre de physique moléculaire optique et hertzienne [CPMOH]
Nguyen, Cattien V [Auteur]
Buchaillot, Lionel [Auteur]

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Marsaudon, Sophie [Auteur]
Centre de physique moléculaire optique et hertzienne [CPMOH]

Journal title :

Nanotechnology

Pages :

475701 (1-8)

Publisher :

Institute of Physics

Publication date :

2009-10-26

ISSN :

0957-4484

English abstract : [en]

Mechanical response of carbon nanotube atomic force microscope probes are investigated using a thermal noise forcing. Thermal noise spectra are able to investigate mechanical behaviors that cannot be studied using classical ...
Show more >Mechanical response of carbon nanotube atomic force microscope probes are investigated using a thermal noise forcing. Thermal noise spectra are able to investigate mechanical behaviors that cannot be studied using classical atomic force microscope modes. Experimental results show that the carbon nanotube contacts can be classified in two categories: the free sliding and pinned cases. The pinned contact case requires the description of the cantilever flexural vibrations with support spring-coupled cantilever boundary conditions. Our experimental results show that carbon nanotubes exhibit different contact behaviors with a surface, and in turn different mechanical responses.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL

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