• English
    • français
  • Help
  •  | 
  • Contact
  •  | 
  • About
  •  | 
  • Login
  • HAL portal
  •  | 
  • Pages Pro
  • EN
  •  / 
  • FR
View Item 
  •   LillOA Home
  • Liste des unités
  • Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520
  • View Item
  •   LillOA Home
  • Liste des unités
  • Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

Experimental study of hot electron inelastic ...
  • BibTeX
  • CSV
  • Excel
  • RIS

Document type :
Autre communication scientifique (congrès sans actes - poster - séminaire...)
DOI :
10.1103/PhysRevB.65.121301
Permalink :
http://hdl.handle.net/20.500.12210/51286
Title :
Experimental study of hot electron inelastic scattering rate in p-type InGaAs
Author(s) :
Sicault, D. [Auteur]
Teissier, R. [Auteur]
Centre d'Electronique et de Micro-optoélectronique de Montpellier [CEM2]
Pardo, F. [Auteur]
Laboratoire de photonique et de nanostructures [LPN]
Pelouard, J.-L. [Auteur]
Laboratoire de photonique et de nanostructures [LPN]
Mollot, F. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Publisher :
American Physical Society
Publication date :
2002-02-15
HAL domain(s) :
Sciences de l'ingénieur [physics]/Electronique
English abstract : [en]
The inelastic scattering rates of electrically injected minority hot electrons measured using a continuous-wave spatially resolved electroluminescence spectroscopy are reported. To our knowledge, this constitutes direct ...
Show more >
The inelastic scattering rates of electrically injected minority hot electrons measured using a continuous-wave spatially resolved electroluminescence spectroscopy are reported. To our knowledge, this constitutes direct experimental determination of this parameter related to the individual inelastic interactions. The evolution of the electron relaxation rate with increasing majority hole density is explored. Remarkably, an attenuation of the scattering rate is measured for p-doping levels higher than 2×1019 cm-3. Additionally, the measured hot-electron energy distributions further indicate that the relaxation mechanisms are dominated by LO phonon-plasmons coupled modes in the range 1018 to 1019 cm-3 hole density. Finally, the temperature dependence of inelastic scattering rate is also measured to learn on the potential implication of ballistic transport in RT operating hot-electron devices.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Internationale
Popular science :
Non
Collections :
  • Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520
Source :
Harvested from HAL
Submission date :
2021-07-27T20:11:51Z
Université de Lille

Mentions légales
Université de Lille © 2017