DIFFUSION AND NOISE IN GAAS MATERIAL AND DEVICES

Demurcia, M.; Gasquet, D.; Elamri, A.; Nougier, J.-P.; Vanbremeersch, J.

Document type :

Article dans une revue scientifique

DOI :

10.1109/16.97419

Title :

DIFFUSION AND NOISE IN GAAS MATERIAL AND DEVICES

Author(s) :

Demurcia, M. [Auteur]
Centre d'Electronique et de Micro-optoélectronique de Montpellier [CEM2]
Gasquet, D. [Auteur]
Centre d'Electronique et de Micro-optoélectronique de Montpellier [CEM2]
Elamri, A. [Auteur]
Centre d'Electronique et de Micro-optoélectronique de Montpellier [CEM2]
Nougier, J.-P. [Auteur]
Centre d'Electronique et de Micro-optoélectronique de Montpellier [CEM2]
Vanbremeersch, J. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Journal title :

IEEE Transactions on Electron Devices

Pages :

2531-2539

Publisher :

Institute of Electrical and Electronics Engineers

Publication date :

1991-11

ISSN :

0018-9383

Keyword(s) :

ELECTRON-TRANSPORT PROPERTIES
HOT CARRIERS
SEMICONDUCTORS
TRANSIENT

HAL domain(s) :

Sciences de l'ingénieur [physics]/Electronique

English abstract : [en]

The variation of the diffusion coefficent D(E) versus the electric field strength E, is determined at 300 K in n-type GaAs (N(D) = 3 x 10(-17) cm-3), using pulsed high-frequency noise measurements. D(E) is found to increase ...
Show more >The variation of the diffusion coefficent D(E) versus the electric field strength E, is determined at 300 K in n-type GaAs (N(D) = 3 x 10(-17) cm-3), using pulsed high-frequency noise measurements. D(E) is found to increase slightly at low field, then to decrease down to one tenth of its ohmic value near the threshold field. "Long" (greater-than-or-equal-to 4-mu-m) real n+-n-n+ Gunn diodes, with an arbitrary doping profile, can be modeled. Comparisons are made, and excellent agreement is found, between experimental and theoretical characteristics of two real diodes, with notch and with gradual doping profiles. The doping profile N(D)(x) is shown to have a considerable influence on the diode behavior, concerning the electric field profile as well as the noise characteristics. Using the impedance field method, the noise current is modeled and found to be very sensitive in the D(E) variation law, in particular in the range of 2.5-4 kV/cm. The agreement between the experimental noise and the computed noise of real diodes is found to be quite satisfactory when using D(E) determined in the present work, and important discrepancies occur when using other D(E) variations, both theoretical and experimental, found in the literature.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL

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