Proximity Effect of Neighbour Victim Lossy ...
Document type :
Communication dans un congrès avec actes
Title :
Proximity Effect of Neighbour Victim Lossy Interconnects on a Single Attacker and Vice Versa
Author(s) :
Ponchel, Freddy [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Legier, Jean-François [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Paleczny, Erick [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Seguinot, Christophe [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Deschacht, Denis [Auteur]
Conception et Test de Systèmes MICroélectroniques [SysMIC]

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Legier, Jean-François [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Paleczny, Erick [Auteur]

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Seguinot, Christophe [Auteur]

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Deschacht, Denis [Auteur]
Conception et Test de Systèmes MICroélectroniques [SysMIC]
Conference title :
ISIC: International Symposium on Integrated Circuits
City :
Singapore
Country :
Singapour
Start date of the conference :
2007-09-26
Book title :
International Symposium on Integrated Circuits
Journal title :
Proceedings of the 2007 IEEE International Symposium on Integrated Circuits, ISIC-2007
Publisher :
IEEE
Publication date :
2008
HAL domain(s) :
Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique
English abstract : [en]
Signal integrity on a set from three to eight lossy copper interconnects of less than one square micron is determined from a transient simulation based on electrical circuit representation. This circuit is deduced from a ...
Show more >Signal integrity on a set from three to eight lossy copper interconnects of less than one square micron is determined from a transient simulation based on electrical circuit representation. This circuit is deduced from a full wave finite element method. Our signal integrity results on numerous possible excitations show that two neighbour interconnects on both sides of a reference aggressor or victim is sufficient to predict more complex situation on largest number of wires. This means that the five interconnects case is also well appropriate. We have verified that it is the best compromise whatever the permittivity of dielectric material which filled the spacing between interconnects, as well as the width of this spacing.Show less >
Show more >Signal integrity on a set from three to eight lossy copper interconnects of less than one square micron is determined from a transient simulation based on electrical circuit representation. This circuit is deduced from a full wave finite element method. Our signal integrity results on numerous possible excitations show that two neighbour interconnects on both sides of a reference aggressor or victim is sufficient to predict more complex situation on largest number of wires. This means that the five interconnects case is also well appropriate. We have verified that it is the best compromise whatever the permittivity of dielectric material which filled the spacing between interconnects, as well as the width of this spacing.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Internationale
Popular science :
Non
Source :