Title :

Inversion of V(z) responses for determination Cij elastic constants by using an optimization method on the singularities of the reflection coefficient

Author(s) :

Benmehrez, Youssef [Auteur]
École des Mines de Douai [Mines Douai EMD]
Lematre, Michael [Auteur]
École des Mines de Douai [Mines Douai EMD]
Bourse, G. [Auteur]
École des Mines de Douai [Mines Douai EMD]
Xu, Wei-Jiang [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Ourak, Mohamed [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Conference title :

QUANTITATIVE NONDESTRUCTIVE EVALUATION

City :

Brunswick

Country :

Etats-Unis d'Amérique

Start date of the conference :

2001-07-29

Book title :

American Institute of Physics Conference Proceedings, 615B

Publisher :

American Institute of Physics

Publication date :

2002

English keyword(s) :

Ultrasonics quantum acoustics and physical effects of sound
Nondestructive testing: ultrasonic testing photoacoustic testing
Elasticity elastic constants

HAL domain(s) :

Sciences de l'ingénieur [physics]

English abstract : [en]

The measurement of the V(z) curve, also called acoustical material signature has been used to determine cij elastic constants. The method is based on the comparison of measured and calculated R(θ,f) reflection coefficient. ...
Show more >The measurement of the V(z) curve, also called acoustical material signature has been used to determine cij elastic constants. The method is based on the comparison of measured and calculated R(θ,f) reflection coefficient. The measured R(θ,f) is determined by inversion of the V(z) curve. The cij elastic constants are obtained by using an optimization method (simplex method), which minimizes the square difference summation Σ|Rm-Rc|2 between the measured and calculated R(θ,f) (phase and modulus) on limited angular ranges. This paper deals with the case of isotropic plates and anisotropic cubic substrates.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL