Conduction band offset in the AlxGayIn1– ...
Document type :
Article dans une revue scientifique
DOI :
Title :
Conduction band offset in the AlxGayIn1–x–yP/Ga0.52In0.48P system as studied by luminescence spectroscopy
Author(s) :
Vignaud, D. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Mollot, F. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Mollot, F. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Journal title :
Journal of Applied Physics
Pages :
384
Publisher :
American Institute of Physics
Publication date :
2003
ISSN :
0021-8979
HAL domain(s) :
Sciences de l'ingénieur [physics]/Electronique
English abstract : [en]
The conducton band offset (CBO) in the AlxGayIn1-x-yP/Ga0.52In0.4 8P heterostructures was measured and analyzed. The methods employed for the measurement included photoluminescence and photoluminescence excitation spectroscopy. ...
Show more >The conducton band offset (CBO) in the AlxGayIn1-x-yP/Ga0.52In0.4 8P heterostructures was measured and analyzed. The methods employed for the measurement included photoluminescence and photoluminescence excitation spectroscopy. The parameters involved in the model solid theory were masured precisely. It was concluded through estimation of parameters of the model solid theory that strained AlxGayIn1-x-yP cannot improve the conduction offset compared to the strain-free material.Show less >
Show more >The conducton band offset (CBO) in the AlxGayIn1-x-yP/Ga0.52In0.4 8P heterostructures was measured and analyzed. The methods employed for the measurement included photoluminescence and photoluminescence excitation spectroscopy. The parameters involved in the model solid theory were masured precisely. It was concluded through estimation of parameters of the model solid theory that strained AlxGayIn1-x-yP cannot improve the conduction offset compared to the strain-free material.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Non spécifiée
Popular science :
Non
Source :
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