A preparation sequence for multi‐analysis ...
Type de document :
Compte-rendu et recension critique d'ouvrage
DOI :
Titre :
A preparation sequence for multi‐analysis of µm‐sized extraterrestrial and geological samples
Auteur(s) :
Aléon‐toppani, Alice [Auteur]
Institut d'astrophysique spatiale [IAS]
Brunetto, Rosario [Auteur]
Institut d'astrophysique spatiale [IAS]
Aléon, Jérôme [Auteur]
Institut de minéralogie, de physique des matériaux et de cosmochimie [IMPMC]
Dionnet, Zelia [Auteur]
Institut d'astrophysique spatiale [IAS]
Rubino, Stefano [Auteur]
Institut d'astrophysique spatiale [IAS]
Levy, Dan [Auteur]
Troadec, David [Auteur]
Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Brisset, François [Auteur]
Institut de Chimie Moléculaire et des Matériaux d'Orsay [ICMMO]
Borondics, Ferenc [Auteur]
Synchrotron SOLEIL [SSOLEIL]
King, Andrew [Auteur]
PSICHÉ beamline
Institut d'astrophysique spatiale [IAS]
Brunetto, Rosario [Auteur]
Institut d'astrophysique spatiale [IAS]
Aléon, Jérôme [Auteur]
Institut de minéralogie, de physique des matériaux et de cosmochimie [IMPMC]
Dionnet, Zelia [Auteur]
Institut d'astrophysique spatiale [IAS]
Rubino, Stefano [Auteur]
Institut d'astrophysique spatiale [IAS]
Levy, Dan [Auteur]
Troadec, David [Auteur]
Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Brisset, François [Auteur]
Institut de Chimie Moléculaire et des Matériaux d'Orsay [ICMMO]
Borondics, Ferenc [Auteur]
Synchrotron SOLEIL [SSOLEIL]
King, Andrew [Auteur]
PSICHÉ beamline
Titre de la revue :
Meteoritics and Planetary Science
Pagination :
1151-1172
Éditeur :
Wiley
Date de publication :
2021-06
ISSN :
1086-9379
Discipline(s) HAL :
Physique [physics]/Astrophysique [astro-ph]/Planétologie et astrophysique de la terre [astro-ph.EP]
Résumé en anglais : [en]
With the recent and ongoing sample return missions and/or the developments of nano-to microscale 3-D and 2-D analytical techniques, it is necessary to develop sample preparation and analysis protocols that allow combination ...
Lire la suite >With the recent and ongoing sample return missions and/or the developments of nano-to microscale 3-D and 2-D analytical techniques, it is necessary to develop sample preparation and analysis protocols that allow combination of different nanometer-to micrometer-scale resolution techniques and both maximize scientific outcome and minimize sample loss and contamination. Here, we present novel sample preparation and analytical procedures to extract a maximum of submicrometer structural, mineralogical, chemical, molecular, and isotopic information from micrometric heterogeneous samples. The sample protocol goes from a nondestructive infrared (IR) tomography of~10 to~70 µm-sized single grains, which provides the distribution and qualitative abundances of both mineral and organic phases, followed by its cutting in several slices at selected sites of interest for 2-D mineralogical analysis (e.g., transmission electron microscopy), molecular organic and mineral analysis (e.g., Raman and/or IR microspectroscopy), and isotopic/chemical analysis (e.g., NanoSIMS). We also discuss here the importance of the focused ion beam microscopy in the protocol, the problems of sample loss and contamination, and at last the possibility of combining successive different analyses in various orders on the same micrometric sample. Special care was notably taken to establish a protocol allowing correlated NanoSIMS/TEM/IR analyses with NanoSIMS performed first. Finally, we emphasize the interest of 3-D and 2-D IR analyses in studying the organics-minerals relationship in combination with more classical isotopic and mineralogical grain characterizations.Lire moins >
Lire la suite >With the recent and ongoing sample return missions and/or the developments of nano-to microscale 3-D and 2-D analytical techniques, it is necessary to develop sample preparation and analysis protocols that allow combination of different nanometer-to micrometer-scale resolution techniques and both maximize scientific outcome and minimize sample loss and contamination. Here, we present novel sample preparation and analytical procedures to extract a maximum of submicrometer structural, mineralogical, chemical, molecular, and isotopic information from micrometric heterogeneous samples. The sample protocol goes from a nondestructive infrared (IR) tomography of~10 to~70 µm-sized single grains, which provides the distribution and qualitative abundances of both mineral and organic phases, followed by its cutting in several slices at selected sites of interest for 2-D mineralogical analysis (e.g., transmission electron microscopy), molecular organic and mineral analysis (e.g., Raman and/or IR microspectroscopy), and isotopic/chemical analysis (e.g., NanoSIMS). We also discuss here the importance of the focused ion beam microscopy in the protocol, the problems of sample loss and contamination, and at last the possibility of combining successive different analyses in various orders on the same micrometric sample. Special care was notably taken to establish a protocol allowing correlated NanoSIMS/TEM/IR analyses with NanoSIMS performed first. Finally, we emphasize the interest of 3-D and 2-D IR analyses in studying the organics-minerals relationship in combination with more classical isotopic and mineralogical grain characterizations.Lire moins >
Langue :
Anglais
Vulgarisation :
Non
Source :
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- Aleon-ToppaniMAPS2021-accepted.pdf
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