Title :

Analytic Modeling of the Coexistence of IEEE 802.15.4 and IEEE 802.11 in Saturation Conditions

Author(s) :

Ngangue Ndih, Eugene David [Auteur]
Cherkaoui, Soumaya [Auteur]
Dayoub, Iyad [Auteur]
COMmunications NUMériques - IEMN [COMNUM - IEMN]

Journal title :

IEEE Communications Letters

Pages :

1981-1984

Publisher :

Institute of Electrical and Electronics Engineers

Publication date :

2015-11

ISSN :

1089-7798

English keyword(s) :

802.11
802.15.4
Coexistence
Markov chain

HAL domain(s) :

Informatique [cs]
Informatique [cs]/Réseaux et télécommunications [cs.NI]
Sciences de l'ingénieur [physics]/Traitement du signal et de l'image [eess.SP]
Informatique [cs]/Intelligence artificielle [cs.AI]
Sciences de l'ingénieur [physics]/Electronique

English abstract : [en]

With the increasing deployment of smart wireless devices using different technologies such as IEEE 802.15.4 and IEEE 802.11 which operate in the same frequency band, it becomes urgent to deeply understand the impact of ...
Show more >With the increasing deployment of smart wireless devices using different technologies such as IEEE 802.15.4 and IEEE 802.11 which operate in the same frequency band, it becomes urgent to deeply understand the impact of this coexistence on the performance of the involved networks. We present in this letter an analytic framework based on Markov chains that captures accurately the behavior of channel access mechanisms in IEEE 802.11 DCF and the unslotted IEEE 802.15.4 when both technologies are coexisting together. The model allows the derivation of metrics such as the probability of successful transmissions, the probability of collision, and the fraction of time that the channel is idle, or experiences successful transmissions for both 802.11 and 802.15.4 nodes. Through extensive simulations of diverse coexistence scenarios, we validate the accuracy of the proposed model, and we analyze the performance of both 802.11 networks and 802.15.4 networks in saturation conditions.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL