Title :

Photonics-Based Near-Field Measurement and Far-Field Characterization for 300-GHz Band Antenna Testing

Author(s) :

Tanaka, Yusuke [Auteur]
Gifu University
Ducournau, Guillaume [Auteur]
Photonique THz - IEMN [PHOTONIQUE THZ - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Belem-Goncalves, Cybelle [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Gianesello, Frederic [Auteur]
Laboratoire de Polytech Nice-Sophia [Polytech'Lab]
Luxey, Cyril [Auteur]
National Institute of Information and Communications Technology [Tokyo, Japan] [NICT]
Watanabe, Issei [Auteur]
National Institute of Information and Communications Technology [Tokyo, Japan] [NICT]
Hirata, Akihiko [Auteur]
Chiba Institute of Technology [CIT]
Sekine, Norihiko [Auteur]
National Institute of Information and Communications Technology [Tokyo, Japan] [NICT]
Kasamatsu, Akifumi [Auteur]
Gifu University
Hisatake, Shintaro [Auteur]
Gifu University

Journal title :

IEEE Open Journal of Antennas and Propagation

Pages :

24-31

Publisher :

IEEE

Publication date :

2022

ISSN :

2637-6431

English keyword(s) :

measurement
photonics technology
planar scanning
300 GHz

HAL domain(s) :

Sciences de l'ingénieur [physics]/Electromagnétisme
Sciences de l'ingénieur [physics]/Electronique
Physique [physics]/Physique [physics]/Instrumentations et Détecteurs [physics.ins-det]

English abstract : [en]

In this study, photonics-based near-field measurement and far-field characterization in a 300-GHz band are demonstrated using an electrooptic (EO) sensor with planar scanning. The field to be measured is up-converted to ...
Show more >In this study, photonics-based near-field measurement and far-field characterization in a 300-GHz band are demonstrated using an electrooptic (EO) sensor with planar scanning. The field to be measured is up-converted to the optical domain (1550 nm) at the EO sensor and delivered to the measurement system with optical fiber. The typical phase drift of the system is 0.46° for the one-dimensional measurement time of 13 s, which is smaller than the standard deviation of the phase measurement of 1.2° for this time scale. The far-field patterns of a horn antenna calculated from the measured near-field distribution are compared with that measured with the direct far-field measurement system using a vector network analyzer. For the angular related parameters, the accuracy of the results obtained by our near-field measurement are comparable to that of those obtained by direct far-field measurements. The sidelobe level discrepancy (approximately 1 dB) between the results obtained based on our near-field measurement and those from the direct far-field measurements are attributed to the excess noise of the probe correction data. We believe that photonics-based near-field measurements with spherical EO probe scanning will pave the way for the characterization of high-gain antennas at the 300-GHz band.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

ANR Project :

Multiplexage SPATIal en gamme térahertz pour les cOmmunications sans fil à 1 TERAbit/s

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL