[Invited] Challenges to measure RF noise ...
Document type :
Communication dans un congrès avec actes
Title :
[Invited] Challenges to measure RF noise and intermodulation performances of mmW/THz devices
Author(s) :
Danneville, Francois [Auteur]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Ghanem, Haitham [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Gonçalves, Joao Carlos Azevedo [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Lepilliet, Sylvie [Auteur]
Plateforme de Caractérisation Multi-Physiques - IEMN [PCMP - IEMN]
Gloria, Daniel [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Ducournau, Guillaume [Auteur]
Photonique THz - IEMN [PHOTONIQUE THZ - IEMN]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Ghanem, Haitham [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Gonçalves, Joao Carlos Azevedo [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Lepilliet, Sylvie [Auteur]
Plateforme de Caractérisation Multi-Physiques - IEMN [PCMP - IEMN]
Gloria, Daniel [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Ducournau, Guillaume [Auteur]
Photonique THz - IEMN [PHOTONIQUE THZ - IEMN]
Conference title :
IEEE Latin American Electron Devices Conference (LAEDC 2022)
City :
Cancun
Country :
Mexique
Start date of the conference :
2022-07-04
English keyword(s) :
mmW
THz
measurement
noise
third order intermodulation point
THz
measurement
noise
third order intermodulation point
HAL domain(s) :
Sciences de l'ingénieur [physics]/Electronique
English abstract : [en]
Applications in millimetre wave range and terahertz frequencies keep on increasing. In this context, drastic challenges are faced at measurement level, in particular to extract noise performance and nonlinear properties ...
Show more >Applications in millimetre wave range and terahertz frequencies keep on increasing. In this context, drastic challenges are faced at measurement level, in particular to extract noise performance and nonlinear properties of devices and circuits used to build the required systems. The aim of this talk is to provide an overview of these challenges, and to describe the solutions that we have developed to respond to them.Show less >
Show more >Applications in millimetre wave range and terahertz frequencies keep on increasing. In this context, drastic challenges are faced at measurement level, in particular to extract noise performance and nonlinear properties of devices and circuits used to build the required systems. The aim of this talk is to provide an overview of these challenges, and to describe the solutions that we have developed to respond to them.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Internationale
Popular science :
Non
Source :
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