Title :

[Invited] Challenges to measure RF noise and intermodulation performances of mmW/THz devices

Author(s) :

Danneville, Francois [Auteur]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Ghanem, Haitham [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Gonçalves, Joao Carlos Azevedo [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Lepilliet, Sylvie [Auteur]
Plateforme de Caractérisation Multi-Physiques - IEMN [PCMP - IEMN]
Gloria, Daniel [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Ducournau, Guillaume [Auteur]
Photonique THz - IEMN [PHOTONIQUE THZ - IEMN]

Conference title :

IEEE Latin American Electron Devices Conference (LAEDC 2022)

City :

Cancun

Country :

Mexique

Start date of the conference :

2022-07-04

English keyword(s) :

mmW
THz
measurement
noise
third order intermodulation point

HAL domain(s) :

Sciences de l'ingénieur [physics]/Electronique

English abstract : [en]

Applications in millimetre wave range and terahertz frequencies keep on increasing. In this context, drastic challenges are faced at measurement level, in particular to extract noise performance and nonlinear properties ...
Show more >Applications in millimetre wave range and terahertz frequencies keep on increasing. In this context, drastic challenges are faced at measurement level, in particular to extract noise performance and nonlinear properties of devices and circuits used to build the required systems. The aim of this talk is to provide an overview of these challenges, and to describe the solutions that we have developed to respond to them.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL