Title :

Aluminosilicate glass thin films elaborated by pulsed laser deposition

Author(s) :

Carlier, Thibault [Auteur]
Saitzek, Sebastien [Auteur]
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Mear, François [Auteur]
Unité de Catalyse et Chimie du Solide (UCCS) - UMR 8181
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Blach, Jean-Francois [Auteur]
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Ferri, Anthony [Auteur]
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Huvé, Marielle [Auteur]
Unité de Catalyse et Chimie du Solide (UCCS) - UMR 8181
Montagne, Lionel [Auteur]
Unité de Catalyse et Chimie du Solide (UCCS) - UMR 8181
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]

Journal title :

Applied Surface Science

Volume number :

397

Pages :

13-18

Publisher :

Elsevier

Publication date :

2017-03-01

English keyword(s) :

Aluminosilicate glass
Thin film
Pulsed laser deposition
ATR-FTIR spectroscopy
Spectroscopic ellipsometry

HAL domain(s) :

Chimie/Chimie inorganique

English abstract : [en]

In the present work, we report the elaboration of aluminosilicate glass thin films by Pulsed Laser Deposition at various temperatures deposition. The amorphous nature of glass thin films was highlighted by Grazing Incidence ...
Show more >In the present work, we report the elaboration of aluminosilicate glass thin films by Pulsed Laser Deposition at various temperatures deposition. The amorphous nature of glass thin films was highlighted by Grazing Incidence X-Ray Diffraction and no nanocristallites were observed in the glassy matrix. Chemical analysis, obtained with X-ray Photoelectron Spectroscopy and Time of Flight Secondary Ion Mass Spectroscopy, showed a good transfer and homogeneous elementary distribution with of chemical species from the target to the film a. Structural studies performed by Infrared Spectroscopy showed that the substrate temperature plays an important role on the bonding configuration of the layers. A slight shift of Si-O modes to larger wavenumber was observed with the synthesis temperature, assigned to a more strained sub-oxide network. Finally, optical properties of thins film measured by Spectroscopic Ellipsometry are similar to those of the bulk aluminosilicate glass, which indicate a good deposition of aluminosilicate bulk glass.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Administrative institution(s) :

ENSCL
Université de Lille
CNRS
Centrale Lille
Univ. Artois

Collections :

• Unité de Catalyse et Chimie du Solide (UCCS) - UMR 8181

Research team(s) :

Couches minces & nanomatériaux (CMNM)
Matériaux inorganiques, structures, systèmes et propriétés (MISSP)
Oxydes Innovants
RMN et matériaux inorganiques (RM2I)

Submission date :

2019-09-25T14:05:09Z
2021-03-29T09:22:36Z
2023-02-07T11:25:08Z