Aluminosilicate glass thin films elaborated ...
Type de document :
Article dans une revue scientifique: Article original
URL permanente :
Titre :
Aluminosilicate glass thin films elaborated by pulsed laser deposition
Auteur(s) :
Carlier, Thibault [Auteur]
Saitzek, Sebastien [Auteur]
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Mear, François [Auteur]
Unité de Catalyse et Chimie du Solide (UCCS) - UMR 8181
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Blach, Jean-Francois [Auteur]
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Ferri, Anthony [Auteur]
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Huvé, Marielle [Auteur]
Unité de Catalyse et Chimie du Solide (UCCS) - UMR 8181
Montagne, Lionel [Auteur]
Unité de Catalyse et Chimie du Solide (UCCS) - UMR 8181
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Saitzek, Sebastien [Auteur]

Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Mear, François [Auteur]

Unité de Catalyse et Chimie du Solide (UCCS) - UMR 8181
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Blach, Jean-Francois [Auteur]

Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Ferri, Anthony [Auteur]

Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Huvé, Marielle [Auteur]

Unité de Catalyse et Chimie du Solide (UCCS) - UMR 8181
Montagne, Lionel [Auteur]

Unité de Catalyse et Chimie du Solide (UCCS) - UMR 8181
Unité de Catalyse et Chimie du Solide - UMR 8181 [UCCS]
Titre de la revue :
Applied Surface Science
Numéro :
397
Pagination :
13-18
Éditeur :
Elsevier
Date de publication :
2017-03-01
Mot(s)-clé(s) en anglais :
Aluminosilicate glass
Thin film
Pulsed laser deposition
ATR-FTIR spectroscopy
Spectroscopic ellipsometry
Thin film
Pulsed laser deposition
ATR-FTIR spectroscopy
Spectroscopic ellipsometry
Discipline(s) HAL :
Chimie/Chimie inorganique
Résumé en anglais : [en]
In the present work, we report the elaboration of aluminosilicate glass thin films by Pulsed Laser Deposition at various temperatures deposition. The amorphous nature of glass thin films was highlighted by Grazing Incidence ...
Lire la suite >In the present work, we report the elaboration of aluminosilicate glass thin films by Pulsed Laser Deposition at various temperatures deposition. The amorphous nature of glass thin films was highlighted by Grazing Incidence X-Ray Diffraction and no nanocristallites were observed in the glassy matrix. Chemical analysis, obtained with X-ray Photoelectron Spectroscopy and Time of Flight Secondary Ion Mass Spectroscopy, showed a good transfer and homogeneous elementary distribution with of chemical species from the target to the film a. Structural studies performed by Infrared Spectroscopy showed that the substrate temperature plays an important role on the bonding configuration of the layers. A slight shift of Si-O modes to larger wavenumber was observed with the synthesis temperature, assigned to a more strained sub-oxide network. Finally, optical properties of thins film measured by Spectroscopic Ellipsometry are similar to those of the bulk aluminosilicate glass, which indicate a good deposition of aluminosilicate bulk glass.Lire moins >
Lire la suite >In the present work, we report the elaboration of aluminosilicate glass thin films by Pulsed Laser Deposition at various temperatures deposition. The amorphous nature of glass thin films was highlighted by Grazing Incidence X-Ray Diffraction and no nanocristallites were observed in the glassy matrix. Chemical analysis, obtained with X-ray Photoelectron Spectroscopy and Time of Flight Secondary Ion Mass Spectroscopy, showed a good transfer and homogeneous elementary distribution with of chemical species from the target to the film a. Structural studies performed by Infrared Spectroscopy showed that the substrate temperature plays an important role on the bonding configuration of the layers. A slight shift of Si-O modes to larger wavenumber was observed with the synthesis temperature, assigned to a more strained sub-oxide network. Finally, optical properties of thins film measured by Spectroscopic Ellipsometry are similar to those of the bulk aluminosilicate glass, which indicate a good deposition of aluminosilicate bulk glass.Lire moins >
Langue :
Anglais
Comité de lecture :
Oui
Audience :
Internationale
Vulgarisation :
Non
Établissement(s) :
ENSCL
Université de Lille
CNRS
Centrale Lille
Univ. Artois
Université de Lille
CNRS
Centrale Lille
Univ. Artois
Collections :
Équipe(s) de recherche :
Couches minces & nanomatériaux (CMNM)
Matériaux inorganiques, structures, systèmes et propriétés (MISSP)
Oxydes Innovants
RMN et matériaux inorganiques (RM2I)
Matériaux inorganiques, structures, systèmes et propriétés (MISSP)
Oxydes Innovants
RMN et matériaux inorganiques (RM2I)
Date de dépôt :
2019-09-25T14:05:09Z
2021-03-29T09:22:36Z
2023-02-07T11:25:08Z
2021-03-29T09:22:36Z
2023-02-07T11:25:08Z