ToF-SIMS Characterization of Nanostructured ...
Type de document :
Article dans une revue scientifique: Article original
URL permanente :
Titre :
ToF-SIMS Characterization of Nanostructured ZrO2 Coatings Applied to Near Equiatomic Ni-Ti Alloy
Auteur(s) :
Lopes, Natalia Isabel de Azevedo [Auteur]
Freire, Nelson Henrique Jardim [Auteur]
Resende, Pedro Damas [Auteur]
Silva, Jéssica Dornelas [Auteur]
Santos, Leandro de Arruda [Auteur]
Béclin, franck [Auteur]
Unité Matériaux et Transformations - UMR 8207 [UMET]
Unité Matériaux et Transformations (UMET) - UMR 8207
Buono, Vicente Tadeu Lopes [Auteur]
Freire, Nelson Henrique Jardim [Auteur]
Resende, Pedro Damas [Auteur]
Silva, Jéssica Dornelas [Auteur]
Santos, Leandro de Arruda [Auteur]
Béclin, franck [Auteur]
Unité Matériaux et Transformations - UMR 8207 [UMET]
Unité Matériaux et Transformations (UMET) - UMR 8207
Buono, Vicente Tadeu Lopes [Auteur]
Titre de la revue :
Materials Research
Nom court de la revue :
Mat. Res.
Numéro :
22
Éditeur :
FapUNIFESP (SciELO)
Date de publication :
2019
Mot(s)-clé(s) en anglais :
ToF-SIMS
nickel-titanium
zirconia electrodeposition
nanocoating
biomaterials
nickel-titanium
zirconia electrodeposition
nanocoating
biomaterials
Discipline(s) HAL :
Physique [physics]/Matière Condensée [cond-mat]/Science des matériaux [cond-mat.mtrl-sci]
Chimie/Matériaux
Chimie/Matériaux
Résumé en anglais : [en]
The ToF-SIMS technique was applied to analyze thin ZrO2 coatings deposited on the surface of a Ni-Ti alloy. Due to its nanostructured nature, these films are difficult to characterize by conventional techniques. ZrO2 ...
Lire la suite >The ToF-SIMS technique was applied to analyze thin ZrO2 coatings deposited on the surface of a Ni-Ti alloy. Due to its nanostructured nature, these films are difficult to characterize by conventional techniques. ZrO2 coatings were deposited on near equiatomic Ni-Ti wires by pulse electrodeposition. Part of the samples was electrolytically polished before the coating process. The coated samples were then analyzed by ToF-SIMS to evaluate the influence of the deposition time and previous surface electropolishing on the structure of the deposited coating. The results indicate that thicker coatings were produced on the electropolished samples, in comparison with the as-received ones. The best uniformity in thickness was achieved when Ni-Ti samples were previously electropolished followed by ZrO2 electrodeposition for 1200 seconds. Moreover, it was possible to observe by this technique that the inclusions in the Ni-Ti matrix were not entirely covered by the coating.Lire moins >
Lire la suite >The ToF-SIMS technique was applied to analyze thin ZrO2 coatings deposited on the surface of a Ni-Ti alloy. Due to its nanostructured nature, these films are difficult to characterize by conventional techniques. ZrO2 coatings were deposited on near equiatomic Ni-Ti wires by pulse electrodeposition. Part of the samples was electrolytically polished before the coating process. The coated samples were then analyzed by ToF-SIMS to evaluate the influence of the deposition time and previous surface electropolishing on the structure of the deposited coating. The results indicate that thicker coatings were produced on the electropolished samples, in comparison with the as-received ones. The best uniformity in thickness was achieved when Ni-Ti samples were previously electropolished followed by ZrO2 electrodeposition for 1200 seconds. Moreover, it was possible to observe by this technique that the inclusions in the Ni-Ti matrix were not entirely covered by the coating.Lire moins >
Langue :
Anglais
Comité de lecture :
Oui
Audience :
Non spécifiée
Établissement(s) :
Université de Lille
CNRS
INRA
ENSCL
CNRS
INRA
ENSCL
Collections :
Équipe(s) de recherche :
Métallurgie Physique et Génie des Matériaux
Date de dépôt :
2020-01-30T15:52:57Z
2020-02-04T08:49:04Z
2020-03-26T13:39:24Z
2020-02-04T08:49:04Z
2020-03-26T13:39:24Z
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