Title :

Wavelength characterization of an acousto-optic notch filter for unpolarized near-infrared light

Author(s) :

Kastelik, Jean-Claude [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520 [IEMN-DOAE]
Optoélectronique - IEMN [OPTO - IEMN]
Champagne, Justine [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Dupont, Samuel [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520 [IEMN-DOAE]
Optoélectronique - IEMN [OPTO - IEMN]
Yushkov, Konstantin B. [Auteur]
National University of Science and Technology [MISIS]

Journal title :

Applied optics

Pages :

C36-C41

Publisher :

Optical Society of America

Publication date :

2018

ISSN :

1559-128X

HAL domain(s) :

Sciences de l'ingénieur [physics]/Optique / photonique
Sciences de l'ingénieur [physics]/Acoustique [physics.class-ph]

English abstract : [en]

A cascaded system of two acousto-optical cells is proposed and experimentally demonstrated for optical notch rejection filtering in the spectral range from 1400 nm to 1600 nm. Two similar paratellurite acousto-optical ...
Show more >A cascaded system of two acousto-optical cells is proposed and experimentally demonstrated for optical notch rejection filtering in the spectral range from 1400 nm to 1600 nm. Two similar paratellurite acousto-optical devices for unpolarized light are used in a free-space gap of a fiber line. Compensation for birefringence in anisotropic paratellurite devices provides a diffraction regime that is insensitive to polarization of light. High extinction ratios up to 40 dB are measured. (C) 2018 Optical Society of AmericaShow less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL