Effect of thickness and deposition rate ...
Document type :
Article dans une revue scientifique: Article original
Title :
Effect of thickness and deposition rate on the structural and magnetic properties of evaporated Fe/Al thin films
Author(s) :
Mebarki, M. [Auteur]
Layadi, A. [Auteur]
Kerkache, L. [Auteur]
Benabbas, A. [Auteur]
Tiercelin, Nicolas [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Preobrazhensky, Vladimir [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Pernod, Philippe [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Layadi, A. [Auteur]
Kerkache, L. [Auteur]
Benabbas, A. [Auteur]
Tiercelin, Nicolas [Auteur]

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Preobrazhensky, Vladimir [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Pernod, Philippe [Auteur]

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Journal title :
Journal of Superconductivity and Novel Magnetism
Pages :
1951-1957
Publisher :
Springer Verlag
Publication date :
2014
ISSN :
1557-1939
English keyword(s) :
Fe thin film structure
evaporation
XRD
hysteresis curves
evaporation
XRD
hysteresis curves
English abstract : [en]
We report experimental results on the structural and magnetic properties of Fe thin films deposited by thermal evaporation onto polycrystalline Al substrates. The effect of thickness t (in the 76 to 431 nm range) and ...
Show more >We report experimental results on the structural and magnetic properties of Fe thin films deposited by thermal evaporation onto polycrystalline Al substrates. The effect of thickness t (in the 76 to 431 nm range) and deposition rate are investigated. The texture, the strain, and the grain size values were derived from X-ray diffraction (XRD) experiments. The thinner film (76 nm) has no texture, while all other samples have a <110>texture. The strain values ε are small and negative (compressive stress) and equal to −0.1 % for films with t less than 100 nm, it decreases (in absolute value) to −0.07 % and then remains constant for t greater than 100 nm. The grain size values D are found to be between 44 and 73 nm. The grain size decreases with increasing deposition rate regardless of t. Hysteresis curves, inferred from the vibrating sample magnetometer (VSM), show an in-plane magnetic anisotropy for all samples. The squareness S increases and the coercive field H C decreases with increasing D up to D = 55 nm, then they remain constant beyond this grain size value. Higher deposition rates led to smaller grain, smaller remnant magnetization, and higher coercive field. For t = 99 nm, the decrease of the temperature T from room temperature to −130 °C led to 20 and 5 % increases in H C and S, respectively.Show less >
Show more >We report experimental results on the structural and magnetic properties of Fe thin films deposited by thermal evaporation onto polycrystalline Al substrates. The effect of thickness t (in the 76 to 431 nm range) and deposition rate are investigated. The texture, the strain, and the grain size values were derived from X-ray diffraction (XRD) experiments. The thinner film (76 nm) has no texture, while all other samples have a <110>texture. The strain values ε are small and negative (compressive stress) and equal to −0.1 % for films with t less than 100 nm, it decreases (in absolute value) to −0.07 % and then remains constant for t greater than 100 nm. The grain size values D are found to be between 44 and 73 nm. The grain size decreases with increasing deposition rate regardless of t. Hysteresis curves, inferred from the vibrating sample magnetometer (VSM), show an in-plane magnetic anisotropy for all samples. The squareness S increases and the coercive field H C decreases with increasing D up to D = 55 nm, then they remain constant beyond this grain size value. Higher deposition rates led to smaller grain, smaller remnant magnetization, and higher coercive field. For t = 99 nm, the decrease of the temperature T from room temperature to −130 °C led to 20 and 5 % increases in H C and S, respectively.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Non spécifiée
Popular science :
Non
Source :