Title :

Negative refraction of elastic waves in 2D phononic crystals : contribution of resonant transmissions to the construction of the image of a point source

Author(s) :

Hladky, Anne-Christine [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Croenne, Charles [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Dubus, Bertrand [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Vasseur, Jérôme [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Haumesser, L. [Auteur]
Imaging, Brain & Neuropsychiatry [iBraiN]
Manga, D. [Auteur]
Imaging, Brain & Neuropsychiatry [iBraiN]
Morvan, B. [Auteur]
Laboratoire Ondes et Milieux Complexes [LOMC]

Journal title :

Aip Advances

Pages :

0414054

Publisher :

American Institute of Physics- AIP Publishing LLC

Publication date :

2011

ISSN :

2158-3226

HAL domain(s) :

Physique [physics]/Mécanique [physics]/Acoustique [physics.class-ph]

English abstract : [en]

Negative refraction properties of a two-dimensional phononic crystal (PC), made of a triangular lattice of steel rods embedded in epoxy are investigated both experimentally and numerically. First, experiments have been ...
Show more >Negative refraction properties of a two-dimensional phononic crystal (PC), made of a triangular lattice of steel rods embedded in epoxy are investigated both experimentally and numerically. First, experiments have been carried out on a prism shaped PCimmersed in water. Then, for focusing purposes, a flat lens is considered and the construction of the image of a point source is analyzed in details, when indices are matched between the PC and the surrounding fluid medium, whereas acousticimpedances are mismatched. Optimal conditions for focusing longitudinal elastic waves by such PC flat lens are then discussedShow less >

Language :

Anglais

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL