150-GHz RF SOI-CMOS technology in ultrathin ...
Document type :
Article dans une revue scientifique: Article original
DOI :
Title :
150-GHz RF SOI-CMOS technology in ultrathin regime on organic substrate
Author(s) :
Lecavelier Des Etangs-Levallois, A. [Auteur]
Microélectronique Silicium - IEMN [MICROELEC SI - IEMN]
Dubois, Emmanuel [Auteur]
Microélectronique Silicium - IEMN [MICROELEC SI - IEMN]
Lesecq, Marie [Auteur]
Puissance - IEMN [PUISSANCE - IEMN]
Danneville, François [Auteur]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Poulain, L. [Auteur]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Tagro, Y. [Auteur]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Lepilliet, sl [Auteur]
Plateforme de Caractérisation Multi-Physiques - IEMN [PCMP - IEMN]
Gloria, D. [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Raynaud, C. [Auteur]
Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information [CEA-LETI]
Troadec, David [Auteur]
Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Microélectronique Silicium - IEMN [MICROELEC SI - IEMN]
Dubois, Emmanuel [Auteur]

Microélectronique Silicium - IEMN [MICROELEC SI - IEMN]
Lesecq, Marie [Auteur]

Puissance - IEMN [PUISSANCE - IEMN]
Danneville, François [Auteur]

Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Poulain, L. [Auteur]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Tagro, Y. [Auteur]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Lepilliet, sl [Auteur]
Plateforme de Caractérisation Multi-Physiques - IEMN [PCMP - IEMN]
Gloria, D. [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Raynaud, C. [Auteur]
Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information [CEA-LETI]
Troadec, David [Auteur]

Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Journal title :
IEEE Electron Device Letters
Pages :
1510-1512
Publisher :
Institute of Electrical and Electronics Engineers
Publication date :
2011
ISSN :
0741-3106
English keyword(s) :
CMOS
organic substrate
plastic
thin film
organic substrate
plastic
thin film
HAL domain(s) :
Sciences de l'ingénieur [physics]/Electronique
English abstract : [en]
This letter provides an experimental demonstration of high-performance industrial MOSFETs thinned down to 5.7 μm and transferred onto a 125- μm -thick polyethylene naphthalate foil. The die stack transferred onto the organic ...
Show more >This letter provides an experimental demonstration of high-performance industrial MOSFETs thinned down to 5.7 μm and transferred onto a 125- μm -thick polyethylene naphthalate foil. The die stack transferred onto the organic substrate comprises the 200-nm-thick active layer and the 5.5- μm -thick interconnection multilayer stack resulting in a light, compact, and bendable thin film. We unveil that dc and RF performances are invariant even for ultimate thinning down to the buried oxide layer. Furthermore, n-MOSFET performance is improved by 1.5× compared with previous work, and the first demonstration of 100-GHz p-MOSFETs on an organic substrate is presented. Unity-current-gain cutoff and maximum oscillation frequencies as high as 150/160 GHz for n-MOSFETs and 100/130 GHz for p-MOSFETs on a plastic substrate have been measured, respectivelyShow less >
Show more >This letter provides an experimental demonstration of high-performance industrial MOSFETs thinned down to 5.7 μm and transferred onto a 125- μm -thick polyethylene naphthalate foil. The die stack transferred onto the organic substrate comprises the 200-nm-thick active layer and the 5.5- μm -thick interconnection multilayer stack resulting in a light, compact, and bendable thin film. We unveil that dc and RF performances are invariant even for ultimate thinning down to the buried oxide layer. Furthermore, n-MOSFET performance is improved by 1.5× compared with previous work, and the first demonstration of 100-GHz p-MOSFETs on an organic substrate is presented. Unity-current-gain cutoff and maximum oscillation frequencies as high as 150/160 GHz for n-MOSFETs and 100/130 GHz for p-MOSFETs on a plastic substrate have been measured, respectivelyShow less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Non spécifiée
Popular science :
Non
Source :
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