Spatially resolved Raman spectroscopy of ...
Type de document :
Compte-rendu et recension critique d'ouvrage
DOI :
Titre :
Spatially resolved Raman spectroscopy of single- and few-layer graphene
Auteur(s) :
Graf, D. [Auteur]
Molitor, F. [Auteur]
Ensslin, K. [Auteur]
Stampfer, C. [Auteur]
Jungen, A. [Auteur]
Hierold, C. [Auteur]
Wirtz, L. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Molitor, F. [Auteur]
Ensslin, K. [Auteur]
Stampfer, C. [Auteur]
Jungen, A. [Auteur]
Hierold, C. [Auteur]
Wirtz, L. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Titre de la revue :
Nano Letters
Pagination :
238-242
Éditeur :
American Chemical Society
Date de publication :
2007
ISSN :
1530-6984
Discipline(s) HAL :
Sciences de l'ingénieur [physics]
Résumé en anglais : [en]
We present Raman spectroscopy measurements on single- and few-layer graphene flakes. Using a scanning confocal approach we collect spectral data with spatial resolution, which allows us to directly compare Raman images ...
Lire la suite >We present Raman spectroscopy measurements on single- and few-layer graphene flakes. Using a scanning confocal approach we collect spectral data with spatial resolution, which allows us to directly compare Raman images with scanning force micrographs. Single-layer graphene can be distinguished from double- and few-layer by the width of the D’ line: the single peak for single-layer graphene splits into different peaks for the double-layer. These findings are explained using the double-resonant Raman model based on ab-initio calculations of the electronic structure and of the phonon dispersion. We investigate the D line intensity and find no defects within the flake. A finite D line response originating from the edges can be attributed either to defects or to the breakdown of translational symmetryLire moins >
Lire la suite >We present Raman spectroscopy measurements on single- and few-layer graphene flakes. Using a scanning confocal approach we collect spectral data with spatial resolution, which allows us to directly compare Raman images with scanning force micrographs. Single-layer graphene can be distinguished from double- and few-layer by the width of the D’ line: the single peak for single-layer graphene splits into different peaks for the double-layer. These findings are explained using the double-resonant Raman model based on ab-initio calculations of the electronic structure and of the phonon dispersion. We investigate the D line intensity and find no defects within the flake. A finite D line response originating from the edges can be attributed either to defects or to the breakdown of translational symmetryLire moins >
Langue :
Anglais
Vulgarisation :
Non
Source :
Fichiers
- http://arxiv.org/pdf/cond-mat/0607562
- Accès libre
- Accéder au document
- https://hal.archives-ouvertes.fr/hal-00283156/document
- Accès libre
- Accéder au document
- https://hal.archives-ouvertes.fr/hal-00283156/document
- Accès libre
- Accéder au document
- document
- Accès libre
- Accéder au document
- 0607562.pdf
- Accès libre
- Accéder au document
- 0607562
- Accès libre
- Accéder au document