Crystallographic and optical properties ...
Document type :
Compte-rendu et recension critique d'ouvrage
DOI :
Title :
Crystallographic and optical properties of epitaxial Pb(Zr-0.6,Ti-0.4)O-3 thin films grown on LaAlO3 substrates
Author(s) :
Vilquin, B. [Auteur]
Laboratoire de cristallographie et sciences des matériaux [CRISMAT]
Bouregba, R. [Auteur]
Laboratoire de cristallographie et sciences des matériaux [CRISMAT]
Poullain, G. [Auteur]
Laboratoire de cristallographie et sciences des matériaux [CRISMAT]
Murray, H. [Auteur]
Laboratoire de cristallographie et sciences des matériaux [CRISMAT]
Dogheche, El Hadj [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Remiens, Denis [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Laboratoire de cristallographie et sciences des matériaux [CRISMAT]
Bouregba, R. [Auteur]
Laboratoire de cristallographie et sciences des matériaux [CRISMAT]
Poullain, G. [Auteur]
Laboratoire de cristallographie et sciences des matériaux [CRISMAT]
Murray, H. [Auteur]
Laboratoire de cristallographie et sciences des matériaux [CRISMAT]
Dogheche, El Hadj [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Remiens, Denis [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Journal title :
Journal of Applied Physics
Pages :
5167-5171
Publisher :
American Institute of Physics
Publication date :
2003
ISSN :
0021-8979
HAL domain(s) :
Physique [physics]/Matière Condensée [cond-mat]/Science des matériaux [cond-mat.mtrl-sci]
Chimie/Cristallographie
Chimie/Cristallographie
English abstract : [en]
Pb(Zr0.6,Ti0.4)O3 (PZT) thin films are grown in situ on LaAlO3 substrates by rf magnetron sputtering. The relationship between structural and optical properties is investigated as a function of growth temperature. The ...
Show more >Pb(Zr0.6,Ti0.4)O3 (PZT) thin films are grown in situ on LaAlO3 substrates by rf magnetron sputtering. The relationship between structural and optical properties is investigated as a function of growth temperature. The ferroelectric films exhibit satisfying crystallization with epitaxial growth from 475 °C. The optical refractive index value is 2.558, in agreement with the bulk value. The films show homogeneous structure and the squarelike shape of the index profile along with the PZT thickness suggests a good interface quality with the substrate. The crystallographic and optical properties measured on our films tend to demonstrate the suitability of in situ grown PZT films for optical applications.Show less >
Show more >Pb(Zr0.6,Ti0.4)O3 (PZT) thin films are grown in situ on LaAlO3 substrates by rf magnetron sputtering. The relationship between structural and optical properties is investigated as a function of growth temperature. The ferroelectric films exhibit satisfying crystallization with epitaxial growth from 475 °C. The optical refractive index value is 2.558, in agreement with the bulk value. The films show homogeneous structure and the squarelike shape of the index profile along with the PZT thickness suggests a good interface quality with the substrate. The crystallographic and optical properties measured on our films tend to demonstrate the suitability of in situ grown PZT films for optical applications.Show less >
Language :
Anglais
Popular science :
Non
Source :
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