Analytical transport model of AlGaN/GaN ...
Document type :
Communication dans un congrès avec actes
Title :
Analytical transport model of AlGaN/GaN HEMT based on electrical and thermal measurement
Author(s) :
Jacquet, Jean-Claude [Auteur]
Thales Research and Technologies [Orsay] [TRT]
Aubry, Raphaël [Auteur]
Gerard, H. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Delos, E. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Rolland, Nathalie [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Cordier, Yvon [Auteur]
Centre de recherche sur l'hétéroepitaxie et ses applications [CRHEA]
Bussutil, A. [Auteur]
Thales Research and Technologies [Orsay] [TRT]
Rousseau, Michel [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Delage, Sylvain Laurent [Auteur]
Thales Research and Technologies [Orsay] [TRT]
Thales Research and Technologies [Orsay] [TRT]
Aubry, Raphaël [Auteur]
Gerard, H. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Delos, E. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Rolland, Nathalie [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Cordier, Yvon [Auteur]
Centre de recherche sur l'hétéroepitaxie et ses applications [CRHEA]
Bussutil, A. [Auteur]
Thales Research and Technologies [Orsay] [TRT]
Rousseau, Michel [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Delage, Sylvain Laurent [Auteur]
Thales Research and Technologies [Orsay] [TRT]
Conference title :
12th European Gallium Arsenide and other compound semiconductors application symposium
City :
Amsterdam
Country :
Pays-Bas
Start date of the conference :
2004-10-11
Book title :
Proceedings of the 12th European Gallium Arsenide and Other Semiconductor Application Symposium, GAAS 2004
Publisher :
Horizon House Publications Ltd, London. UK
Publication date :
2004
HAL domain(s) :
Sciences de l'ingénieur [physics]
English abstract : [en]
GaN and its related alloys constitute a family of wide bandgap semiconductors suitable to optoelectronics and power microwave applications. For the latter applications, their high breakdown fields in the 3MV/cm range and ...
Show more >GaN and its related alloys constitute a family of wide bandgap semiconductors suitable to optoelectronics and power microwave applications. For the latter applications, their high breakdown fields in the 3MV/cm range and their high peak electron velocity above 107cm/s are crucial. The high electron mobility transistor (HEMT) based on GaN is suitable to high frequencies and power applications. Moreover, those materials show excellent chemical and metallurgical stability. One peculiarity of GaN is stemming from the fact that the crystal growth is mostly achieved by heteroepitaxy since no commercial GaN substrates are yet available. The substrates currently chosen are sapphire, silicon carbide and silicon. The high power RF device performance decreases as operation temperature increases (e.g. fall of electron mobility impacting the cut-off frequencies and degradation of device reliability) so it is very important to understand the thermal effect in the device. This work present an analytical model of electron transport based on, at one hand, experimental characterisation such as I-V pulsed measurement, thermal characterisation and, at the other hand, thermal simulation and physical analysis. We were able to derive the variation of the electron velocity model as a function of temperature thanks to the thermal characterisation of parameters such electron mobility, ohmic contact, carrier density and gate Schottky barrier.Show less >
Show more >GaN and its related alloys constitute a family of wide bandgap semiconductors suitable to optoelectronics and power microwave applications. For the latter applications, their high breakdown fields in the 3MV/cm range and their high peak electron velocity above 107cm/s are crucial. The high electron mobility transistor (HEMT) based on GaN is suitable to high frequencies and power applications. Moreover, those materials show excellent chemical and metallurgical stability. One peculiarity of GaN is stemming from the fact that the crystal growth is mostly achieved by heteroepitaxy since no commercial GaN substrates are yet available. The substrates currently chosen are sapphire, silicon carbide and silicon. The high power RF device performance decreases as operation temperature increases (e.g. fall of electron mobility impacting the cut-off frequencies and degradation of device reliability) so it is very important to understand the thermal effect in the device. This work present an analytical model of electron transport based on, at one hand, experimental characterisation such as I-V pulsed measurement, thermal characterisation and, at the other hand, thermal simulation and physical analysis. We were able to derive the variation of the electron velocity model as a function of temperature thanks to the thermal characterisation of parameters such electron mobility, ohmic contact, carrier density and gate Schottky barrier.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Internationale
Popular science :
Non
Source :