Titre :

Design and experimental verification of backward wave propagation in periodic waveguide structures

Auteur(s) :

Carbonell, Jorge [Auteur]
Universitat Politècnica de València = Universitad Politecnica de Valencia = Polytechnic University of Valencia [UPV]
Rogla, Luis J. [Auteur]
Universitat Politècnica de València = Universitad Politecnica de Valencia = Polytechnic University of Valencia [UPV]
Boria, Vicente [Auteur]
Universitat Politècnica de València = Universitad Politecnica de Valencia = Polytechnic University of Valencia [UPV]
Lippens, Didier [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Titre de la revue :

IEEE Transactions on Microwave Theory and Techniques

Pagination :

1527-1533

Éditeur :

Institute of Electrical and Electronics Engineers

Date de publication :

2006-06

ISSN :

0018-9480

Mot(s)-clé(s) en anglais :

Periodic structures
Dielectric loss measurement
Electromagnetic waveguides
Dielectric measurements
Propagation losses
Prototypes
Length measurement
Dielectric losses
Loss measurement
Electromagnetic measurements

Discipline(s) HAL :

Sciences de l'ingénieur [physics]

Résumé en anglais : [en]

Experimental results for the demonstration of backward-wave or double-negative (DNG) propagation in waveguide technology combining inductive windows and split-ring resonators are presented and discussed in depth. A novel ...
Lire la suite >Experimental results for the demonstration of backward-wave or double-negative (DNG) propagation in waveguide technology combining inductive windows and split-ring resonators are presented and discussed in depth. A novel segmented prototype has been designed, fabricated, and measured, thus allowing the analysis and discussion of different length structures. The experimental characterization proves the DNG nature of the devices by comparing the phase of the transmission coefficient S/sub 21/ for different length structures. Dielectric and metallic losses linked to the resonators also limit the transmission levels of these very compact structures in the longitudinal dimension, and the sources of such losses are interpreted through the comparison of measured results with full-wave electromagnetic simulations.Lire moins >

Langue :

Anglais

Vulgarisation :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL