Thermal response and correlation between ...
Document type :
Compte-rendu et recension critique d'ouvrage
Title :
Thermal response and correlation between mobility and kink effect in GaN HEMTs
Author(s) :
Alim, Mohammad A. [Auteur correspondant]
Afrin, S. [Auteur]
Rezazadeh, A. A. [Auteur]
Gaquiere, Christophe [Auteur]
Puissance - IEMN [PUISSANCE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Afrin, S. [Auteur]
Rezazadeh, A. A. [Auteur]
Gaquiere, Christophe [Auteur]

Puissance - IEMN [PUISSANCE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Journal title :
MICROELECTRONIC ENGINEERING
Pages :
111148, 5 pages
Publisher :
Elsevier
Publication date :
2020-01-15
ISSN :
0167-9317
English keyword(s) :
AlGaN/GaN FET
Mobility
Kink effect
Traps
Thermal behaviour
Mobility
Kink effect
Traps
Thermal behaviour
HAL domain(s) :
Sciences de l'ingénieur [physics]
English abstract : [en]
This work notices the relation among the kink effect and the mobility in AlGaN/GaN HEMT and its response to temperature. The kink phenomenon found in transistor behaviour are carefully characterized at persuade point which ...
Show more >This work notices the relation among the kink effect and the mobility in AlGaN/GaN HEMT and its response to temperature. The kink phenomenon found in transistor behaviour are carefully characterized at persuade point which is straightaway linked to the shallow traps positioned underneath the conduction band. A straightforward relationship among parasitic impacts within the output properties and the existence of deep levels or traps would demonstrate by a temperature-dependent mobility model. This study helps to predict the location of kink voltage in terms of gate bias near to the threshold voltage and also emphasize the impact of the mobility scattering. In expansion, the traps states for GaN HEMT grown on SiC substrate and their related activation energy based on existing literature also summarized.Show less >
Show more >This work notices the relation among the kink effect and the mobility in AlGaN/GaN HEMT and its response to temperature. The kink phenomenon found in transistor behaviour are carefully characterized at persuade point which is straightaway linked to the shallow traps positioned underneath the conduction band. A straightforward relationship among parasitic impacts within the output properties and the existence of deep levels or traps would demonstrate by a temperature-dependent mobility model. This study helps to predict the location of kink voltage in terms of gate bias near to the threshold voltage and also emphasize the impact of the mobility scattering. In expansion, the traps states for GaN HEMT grown on SiC substrate and their related activation energy based on existing literature also summarized.Show less >
Language :
Anglais
Popular science :
Non
Source :