Title :

Table-free multiple bit-error correction using the CRC syndrome

Author(s) :

Boussard, Vivien [Auteur correspondant]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Coulombe, Stephane [Auteur]
Université du Québec à Montréal = University of Québec in Montréal [UQAM]
Coudoux, François-Xavier [Auteur]
COMmunications NUMériques - IEMN [COMNUM - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Corlay, Patrick [Auteur]
COMmunications NUMériques - IEMN [COMNUM - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]

Journal title :

IEEE ACCESS

Pages :

102357-102372

Publisher :

IEEE

Publication date :

2020

ISSN :

2169-3536

English keyword(s) :

Data communication
error correction
cyclic redundancy check (CRC)
Internet of Things (IoT)
Bluetooth low energy (BLE)

HAL domain(s) :

Sciences de l'ingénieur [physics]/Traitement du signal et de l'image [eess.SP]
Informatique [cs]/Réseaux et télécommunications [cs.NI]

English abstract : [en]

In this paper, we propose a novel method for correcting multiple errors in data packets, using the Cyclic Redundancy Check (CRC) syndrome present in low layers of protocol stacks. The proposed method generates the whole ...
Show more >In this paper, we propose a novel method for correcting multiple errors in data packets, using the Cyclic Redundancy Check (CRC) syndrome present in low layers of protocol stacks. The proposed method generates the whole list of error patterns, leading to a received syndrome containing up to a given maximum number of errors. Our approach is table-free, is computationally efficient, and can instantly correct erroneous packets when the output list contains a single element. A performance study is conducted, and shows that the proposed approach outperforms existing ones in Bluetooth Low Energy (BLE) as it can correct all single- and double-error patterns as well as most triple-error cases when considering small payloads used in Internet of Things (IoT) applications.Show less >

Language :

Anglais

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL