Title :

An optimal dimensioning method of a green wall structure for noise pollution reduction

Author(s) :

Attal, Emmanuel [Auteur]
Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174) [FEMTO-ST]
Dubus, Bertrand [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Leblois, Thérèse [Auteur]
Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174) [FEMTO-ST]
Cretin, Bernard [Auteur]
Franche-Comté Électronique Mécanique, Thermique et Optique - Sciences et Technologies (UMR 6174) [FEMTO-ST]

Journal title :

Building and Environment

Pages :

107362

Publisher :

Elsevier

Publication date :

2021

ISSN :

0360-1323

English keyword(s) :

Noise reduction
Substrate
Foliage
Multi-layer
Return loss
Transmission loss

HAL domain(s) :

Sciences de l'ingénieur [physics]/Génie civil/Eco-conception
Sciences de l'ingénieur [physics]/Acoustique [physics.class-ph]
Sciences de l'ingénieur [physics]/Matériaux

English abstract : [en]

This paper concern the optimization of a multilayered green wall structure including substrate and foliage in order to reduce as much as possible backward noise reflection and forward transmission from the wall. Each ...
Show more >This paper concern the optimization of a multilayered green wall structure including substrate and foliage in order to reduce as much as possible backward noise reflection and forward transmission from the wall. Each component involved in the wall structure is fully characterized experimentally to get its transfer matrix. Simulation demonstrated that foliage layer superimposed to substrate layer doesn't affect the transmission losses but contributes greatly to the increase of return losses of the green wall structure. To achieve the best performances in terms of return and forward losses as well as frequency bandwidth, the methods of optimization are discussed including selection of types of materials, thicknesses, arrangement of layers as parameters.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL

Submission date :

2021-12-02T05:01:08Z