Load-Pull Setup Development at 185 GHz for ...
Document type :
Compte-rendu et recension critique d'ouvrage
Title :
Load-Pull Setup Development at 185 GHz for On-Wafer Characterization of SiGe HBT in BiCMOS 55 nm Technology
Author(s) :
Maye, Caroline [Auteur correspondant]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
lepilliet, sl [Auteur]
Plateforme de Caractérisation Multi-Physiques - IEMN [PCMP - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Okada, Etienne [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Plateforme de Caractérisation Multi-Physiques - IEMN [PCMP - IEMN]
Margalef-Rovira, Marc [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
Alaji, Issa [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
Gloria, Daniel [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Ducournau, Guillaume [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Photonique THz - IEMN [PHOTONIQUE THZ - IEMN]
Gaquiere, Christophe [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
lepilliet, sl [Auteur]
Plateforme de Caractérisation Multi-Physiques - IEMN [PCMP - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Okada, Etienne [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Plateforme de Caractérisation Multi-Physiques - IEMN [PCMP - IEMN]
Margalef-Rovira, Marc [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
Alaji, Issa [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
Gloria, Daniel [Auteur]
STMicroelectronics [Crolles] [ST-CROLLES]
Ducournau, Guillaume [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Photonique THz - IEMN [PHOTONIQUE THZ - IEMN]
Gaquiere, Christophe [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Puissance - IEMN [PUISSANCE - IEMN]
Journal title :
IEEE Transactions on Microwave Theory and Techniques
Pages :
pp 444-452
Publisher :
Institute of Electrical and Electronics Engineers
Publication date :
2022-01
ISSN :
0018-9480
English keyword(s) :
Tuners
Impedance
Radio frequency
Power measurement
Frequency measurement
Power generation
Calibration
Impedance
Radio frequency
Power measurement
Frequency measurement
Power generation
Calibration
HAL domain(s) :
Sciences de l'ingénieur [physics]
English abstract : [en]
This article aims to discuss challenges and performances of a passive load-pull test bench dedicated to the G-band frequencies. The first task of this work is the development of the setup to perform high power generation, ...
Show more >This article aims to discuss challenges and performances of a passive load-pull test bench dedicated to the G-band frequencies. The first task of this work is the development of the setup to perform high power generation, impedance generation, and high-power dynamic of measurement. The solution proposed is the association of an external power system of source and detectors, with an integrated synthesizer of impedance. The proposed system requires several analysis steps in order to be validated. On the other hand, special care is dedicated to the calibration of the scalar measurement in the millimeter-wave frequency range. Then, due to the unknown phase at the input and output of the device under test (DUT), scalar measurement can lead to high inaccuracy. Hence, an adaptive calibration is proposed and applied to the measurement of a bipolar transistor at 185 GHz. We highlight the effect of the missing phase information on the accuracy of measurement. Results of the measurement are discussed.Show less >
Show more >This article aims to discuss challenges and performances of a passive load-pull test bench dedicated to the G-band frequencies. The first task of this work is the development of the setup to perform high power generation, impedance generation, and high-power dynamic of measurement. The solution proposed is the association of an external power system of source and detectors, with an integrated synthesizer of impedance. The proposed system requires several analysis steps in order to be validated. On the other hand, special care is dedicated to the calibration of the scalar measurement in the millimeter-wave frequency range. Then, due to the unknown phase at the input and output of the device under test (DUT), scalar measurement can lead to high inaccuracy. Hence, an adaptive calibration is proposed and applied to the measurement of a bipolar transistor at 185 GHz. We highlight the effect of the missing phase information on the accuracy of measurement. Results of the measurement are discussed.Show less >
Language :
Anglais
Popular science :
Non
European Project :
Comment :
This article is an expanded version from the 2020 International Workshop on Integrated Nonlinear Microwave and Millimeter-Wave Circuits, Cardiff, 16-17 July 2020.
Source :