Effect of Sn substitution on the energy ...
Document type :
Compte-rendu et recension critique d'ouvrage
Title :
Effect of Sn substitution on the energy storage properties of high (001)-oriented PbZrO3 thin films
Author(s) :
Guo, Xin [Auteur]
Matériaux et Acoustiques pour MIcro et NAno systèmes intégrés - IEMN [MAMINA - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520 [IEMN-DOAE]
State Key Laboratory of High Performance Ceramics and Superfine Microstructure [Shanghai Institute of Ceramics]
Ge, Jun [Auteur]
Matériaux et Acoustiques pour MIcro et NAno systèmes intégrés - IEMN [MAMINA - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520 [IEMN-DOAE]
State Key Laboratory of High Performance Ceramics and Superfine Microstructure [Shanghai Institute of Ceramics]
Ponchel, Freddy [Auteur]
Matériaux et Acoustiques pour MIcro et NAno systèmes intégrés - IEMN [MAMINA - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520 [IEMN-DOAE]
Remiens, Denis [Auteur]
Matériaux et Acoustiques pour MIcro et NAno systèmes intégrés - IEMN [MAMINA - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520 [IEMN-DOAE]
Chen, Ying [Auteur]
State Key Laboratory of High Performance Ceramics and Superfine Microstructure [Shanghai Institute of Ceramics]
Dong, Xianlin [Auteur]
State Key Laboratory of High Performance Ceramics and Superfine Microstructure [Shanghai Institute of Ceramics]
Wang, Genshui [Auteur]
State Key Laboratory of High Performance Ceramics and Superfine Microstructure [Shanghai Institute of Ceramics]
Matériaux et Acoustiques pour MIcro et NAno systèmes intégrés - IEMN [MAMINA - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520 [IEMN-DOAE]
State Key Laboratory of High Performance Ceramics and Superfine Microstructure [Shanghai Institute of Ceramics]
Ge, Jun [Auteur]
Matériaux et Acoustiques pour MIcro et NAno systèmes intégrés - IEMN [MAMINA - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520 [IEMN-DOAE]
State Key Laboratory of High Performance Ceramics and Superfine Microstructure [Shanghai Institute of Ceramics]
Ponchel, Freddy [Auteur]

Matériaux et Acoustiques pour MIcro et NAno systèmes intégrés - IEMN [MAMINA - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520 [IEMN-DOAE]
Remiens, Denis [Auteur]

Matériaux et Acoustiques pour MIcro et NAno systèmes intégrés - IEMN [MAMINA - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - Département Opto-Acousto-Électronique - UMR 8520 [IEMN-DOAE]
Chen, Ying [Auteur]
State Key Laboratory of High Performance Ceramics and Superfine Microstructure [Shanghai Institute of Ceramics]
Dong, Xianlin [Auteur]
State Key Laboratory of High Performance Ceramics and Superfine Microstructure [Shanghai Institute of Ceramics]
Wang, Genshui [Auteur]
State Key Laboratory of High Performance Ceramics and Superfine Microstructure [Shanghai Institute of Ceramics]
Journal title :
Thin Solid Films
Pages :
93-96
Publisher :
Elsevier
Publication date :
2017-06-30
ISSN :
0040-6090
English keyword(s) :
(001) orientation
Antiferroelectric
Energy storage density
Sputtering deposition
Thin films
Tin-substituted lead zirconate
Antiferroelectric
Energy storage density
Sputtering deposition
Thin films
Tin-substituted lead zirconate
HAL domain(s) :
Sciences de l'ingénieur [physics]
Sciences de l'ingénieur [physics]/Optique / photonique
Sciences de l'ingénieur [physics]/Acoustique [physics.class-ph]
Sciences de l'ingénieur [physics]/Optique / photonique
Sciences de l'ingénieur [physics]/Acoustique [physics.class-ph]
English abstract : [en]
Highly (001)-oriented pure PbZrO3 (PZO) films and Sn-substituted PZO films are deposited on (001)-LaNiO3 buffered SiO2/Si substrates by RF magnetron sputtering. Different Sn-substituted PbZrO3 films (PbZr1-xSnxO3, x = 0%, ...
Show more >Highly (001)-oriented pure PbZrO3 (PZO) films and Sn-substituted PZO films are deposited on (001)-LaNiO3 buffered SiO2/Si substrates by RF magnetron sputtering. Different Sn-substituted PbZrO3 films (PbZr1-xSnxO3, x = 0%, 3%, 5%, 10%) with orthorhombic anti-ferroelectric phase are fabricated. The effects of Sn substitution on structure and energy performance have been investigated in detail. The switching electric fields are enlarged and energy loss is lowered by Sn substitution. Recoverable energy density (Wr) of 14.8 ± 0.2 J/cm3 and energy efficiency (η) of 71.2 ± 0.5% at 900 kV/cm are obtained in 5% Sn-substituted PZO film (~ 360 nm). Furthermore, with thicker thickness of ~ 650 nm, Wr and η can be further improved. The Sn-substituted PZO film is believed to be an improved material for applications in energy storage systems and 5% Sn-substituted PZO film exhibits the highest Wr and η in this workShow less >
Show more >Highly (001)-oriented pure PbZrO3 (PZO) films and Sn-substituted PZO films are deposited on (001)-LaNiO3 buffered SiO2/Si substrates by RF magnetron sputtering. Different Sn-substituted PbZrO3 films (PbZr1-xSnxO3, x = 0%, 3%, 5%, 10%) with orthorhombic anti-ferroelectric phase are fabricated. The effects of Sn substitution on structure and energy performance have been investigated in detail. The switching electric fields are enlarged and energy loss is lowered by Sn substitution. Recoverable energy density (Wr) of 14.8 ± 0.2 J/cm3 and energy efficiency (η) of 71.2 ± 0.5% at 900 kV/cm are obtained in 5% Sn-substituted PZO film (~ 360 nm). Furthermore, with thicker thickness of ~ 650 nm, Wr and η can be further improved. The Sn-substituted PZO film is believed to be an improved material for applications in energy storage systems and 5% Sn-substituted PZO film exhibits the highest Wr and η in this workShow less >
Language :
Anglais
Popular science :
Non
Comment :
JIF=1.939
Source :