Title :

Evaluation of the Electric Field Amplitude in a MSRC From Power Measurement with a monopole

Author(s) :

Ibrahim, Abdourachid [Auteur]
Université de Djibouti
Kone, Lamine [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Baranowski, Sylvie [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
COMmunications NUMériques - IEMN [COMNUM - IEMN]

Conference title :

2018 2nd URSI Atlantic Radio Science Meeting (AT-RASC)

City :

Gran Canaria

Country :

Espagne

Start date of the conference :

2018-05-28

Publisher :

IEEE

English keyword(s) :

Antenna measurements
Power measurement
Electric fields
Frequency measurement
Horn antennas
Adaptive arrays

HAL domain(s) :

Informatique [cs]
Informatique [cs]/Intelligence artificielle [cs.AI]
Informatique [cs]/Réseaux et télécommunications [cs.NI]
Sciences de l'ingénieur [physics]
Sciences de l'ingénieur [physics]/Traitement du signal et de l'image [eess.SP]
Sciences de l'ingénieur [physics]/Electronique

English abstract : [en]

The goal of the work presented in this paper is to demonstrate that the electric field inside a Mode Stirred Reverberation Chamber (MSRC) can be evaluated with short monopoles, mounted on the walls of the MSRC. Indeed, the ...
Show more >The goal of the work presented in this paper is to demonstrate that the electric field inside a Mode Stirred Reverberation Chamber (MSRC) can be evaluated with short monopoles, mounted on the walls of the MSRC. Indeed, the electric (E) field amplitude inside a MSRC can be deduced from power measurement realized with monopole if one takes into account the statistical laws followed by the power and the components of the E field. The results obtained with this method are compared to measurements performed with conventional methods using E field probes (direct measurement) or matched antennas (indirect measurement) installed inside the working volume. The good agreement of these comparisons validates the proposed method.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL