Title :

Characterization of electro-optic coefficients r13 , r23 and r33 in single crystalline BaTiO3 thin films

Author(s) :

Cao, Yu [Auteur]
National University of Singapore [NUS]
Al Meselmene, Nour [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Dogheche, El Hadj [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Optoélectronique - IEMN [OPTO - IEMN]
Yang, Ping [Auteur]
National University of Singapore [NUS]
Moitra, Parikshit [Auteur]
Li, Shi Qiang [Auteur]
Venkatesan, Thirumalai [Auteur]
National University of Singapore [NUS]
Danner, Aaron [Auteur correspondant]
National University of Singapore [NUS]

Journal title :

Optical Materials Express

Pages :

152

Publisher :

OSA pub

Publication date :

2023

ISSN :

2159-3930

HAL domain(s) :

Physique [physics]/Matière Condensée [cond-mat]/Science des matériaux [cond-mat.mtrl-sci]

English abstract : [en]

We report experimental characterization of DC electro-optic coefficients r 13 , r 23 and r 33 in thin film single crystalline BaTiO3 on DyScO3 . The epitaxial BaTiO3 thin film is sandwiched between a SrRuO3 bottom electrode ...
Show more >We report experimental characterization of DC electro-optic coefficients r 13 , r 23 and r 33 in thin film single crystalline BaTiO3 on DyScO3 . The epitaxial BaTiO3 thin film is sandwiched between a SrRuO3 bottom electrode and an indium tin oxide (ITO) top electrode. We characterize the DC electro-optic coefficients r 13 , r 23 , and r 33 by the prism coupling method at 636.6 nm for the BaTiO3 thin film. The results show the DC coefficients r 13 = 4.2 pm/V, r 23 = 4.6 pm/V and r 33 = 9.0 pm/V.Show less >

Language :

Anglais

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL