Title :

Fault detection and localization in unshielded twisted pair cable based on observability analysis and reflectometry experimental measurements.

Author(s) :

Som, Hermine Judith Idellette [Auteur]
Université de Douala
Cocquempot, Vincent [Auteur]
Centre de Recherche en Informatique, Signal et Automatique de Lille - UMR 9189 [CRIStAL]
Degardin, Virginie [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Télécommunication, Interférences et Compatibilité Electromagnétique - IEMN [TELICE - IEMN]

Journal title :

Measurement Science and Technology

Pages :

015034

Publisher :

IOP Publishing

Publication date :

2024-01

ISSN :

0957-0233

English keyword(s) :

Fault diagnosis
cable
Reflectometry
Observability
Transport flow systems
Transmission line and cable testing

HAL domain(s) :

Sciences de l'ingénieur [physics]
Informatique [cs]/Automatique
Informatique [cs]/Réseaux et télécommunications [cs.NI]
Physique [physics]

English abstract : [en]

In this paper, an efficient method is proposed for detecting and locating a soft fault, i.e. a physical degradation, in a Y -shaped network of unshielded twisted pair cables. The method uses jointly the observability ...
Show more >In this paper, an efficient method is proposed for detecting and locating a soft fault, i.e. a physical degradation, in a Y -shaped network of unshielded twisted pair cables. The method uses jointly the observability analysis and time-frequency domain reflectometry experimental measurements. The fault detection consists in checking the consistency between the known characteristics of the cable under no-fault and faulty conditions, with the maximum value of a normalized time-frequency crosscorrelation function computed on a sliding time window whose length is equal to the boundary exact observability time. The cable transmission speed and the wired network observability time are combined to locate precisely the fault. Soft faults are artificially created by connecting resistors of different values to the test cable. Experimental results show the efficiency of our fault detection and localization method.Show less >

Language :

Anglais

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL