Title :

On-chip very low strain rate rheology of amorphous olivine films

Author(s) :

COULOMBIER, Michaël [Auteur]
Institute of Mechanics, Materials and Civil Engineering [Louvain] [IMMC]
BARAL, Paul [Auteur]
Centre Science des Matériaux et des Structures [SMS-ENSMSE]
OREKHOV, Andrey [Auteur]
University of Antwerp [UA]
DOHMEN, Ralf [Auteur]
Ruhr University Bochum = Ruhr-Universität Bochum [RUB]
RASKIN, Jean Pierre [Auteur]
Institute of Information and Communication Technologies, Electronics and Applied Mathematics [ICTEAM]
PARDOEN, Thomas [Auteur]
Institute of Mechanics, Materials and Civil Engineering [Louvain] [IMMC]
Cordier, Patrick [Auteur]
Unité Matériaux et Transformations (UMET) - UMR 8207
IDRISSI, Hosni [Auteur]
University of Antwerp [UA]
Institute of Mechanics, Materials and Civil Engineering [Louvain] [IMMC]

Journal title :

Acta Materialia

Abbreviated title :

Acta Materialia

Volume number :

266

Pages :

119693

Publisher :

Elsevier BV

Publication date :

2024-01-20

ISSN :

1359-6454

HAL domain(s) :

Physique [physics]/Matière Condensée [cond-mat]/Science des matériaux [cond-mat.mtrl-sci]

English abstract : [en]

Recent observations made by the authors revealed the activation of stress induced amorphization and sliding at grain boundary in olivine, a mechanism which is expected to play a pivotal role in the viscosity drop at the ...
Show more >Recent observations made by the authors revealed the activation of stress induced amorphization and sliding at grain boundary in olivine, a mechanism which is expected to play a pivotal role in the viscosity drop at the lithosphere-asthenosphere boundary and the brittle-ductile transition in the lithospheric mantle. However, there is a lack of information in the literature regarding the intrinsic mechanical properties and the elementary deformation mechanisms of this material, especially at time scales relevant for geodynamics. In the present work, amorphous olivine films were obtained by pulsed laser deposition (PLD). The mechanical response including the rate dependent behavior are investigated using a tension-on-chip (TOC) method developed at UCLouvain allowing to perform creep/relaxation tests on thin films at extremely low strain rates. In the present work, strain rate down to 10-12 s-1 was reached which is unique. High strain rate sensitivity of 0.054 is observed together with the activation of relaxation at the very early stage of deformation. Furthermore, digital image correlation (DIC), used for the first time on films deformed by TOC, reveals local strain heterogeneities. The relationship between such heterogeneities, the high strain rate sensitivity and the effect of the electron beam in the scanning electron microscope is discussed and compared to the literature.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

European Project :

Rheology of Earth materials: closing the gap between TIMEscales in the laboratory and in the MANtle

Administrative institution(s) :

Université de Lille
CNRS
INRAE
ENSCL

Collections :

• Unité Matériaux et Transformations (UMET) - UMR 8207

Research team(s) :

Plasticité

Submission date :

2024-01-20T08:26:57Z
2024-01-24T11:55:23Z