Title :

Smart Full-Exploitation of Beamforming Fusion assisted Spectrum Sensing for Cognitive Radio

Author(s) :

Ben Chaabane, Sarra [Auteur correspondant]
Université de Tunis El Manar [UTM]
Bouallegue, Kais [Auteur]
Institut d'Électronique et des Technologies du numéRique [IETR]
Belazi, Akram [Auteur]
Université de Tunis El Manar [UTM]
Kharbech, Sofiane [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Université de Tunis El Manar [UTM]
Bouallegue, Ammar [Auteur]
Université de Tunis El Manar [UTM]

Conference title :

18th International Conference on Wireless and Mobile Computing, Networking and Communications (WiMob)

City :

Thessaloniki

Country :

Grèce

Start date of the conference :

2022-10-10

Book title :

18th International Conference on Wireless and Mobile Computing, Networking and Communications (WiMob)

Journal title :

2022 18TH INTERNATIONAL CONFERENCE ON WIRELESS AND MOBILE COMPUTING, NETWORKING AND COMMUNICATIONS (WIMOB)

Publisher :

IEEE

Publication date :

2022

English keyword(s) :

Cognitive radio
spectrum sensing
fusion detection
beamforming

HAL domain(s) :

Sciences de l'ingénieur [physics]

English abstract : [en]

This paper proposes blind spectrum sensing (SS) in a narrowband context called Beamforming Fusion assisted Spectrum Sensing (BFSS). Considering a channel with angles of arrival (AoA), we jointly exploit beamforming algorithms ...
Show more >This paper proposes blind spectrum sensing (SS) in a narrowband context called Beamforming Fusion assisted Spectrum Sensing (BFSS). Considering a channel with angles of arrival (AoA), we jointly exploit beamforming algorithms to make decisions about the detection of users on frequency resources. The proposed method is totally blind and does not require knowledge of the noise power, the channel estimation, and the source signal. A state-of-the-art comparison of SS methods using beamforming is provided to validate our contribution in a shallow SNR region.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Institut d'Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520

Source :

Harvested from HAL