Extending the analysis of EELS spectrum-imaging ...
Document type :
Article dans une revue scientifique
Permalink :
Title :
Extending the analysis of EELS spectrum-imaging data, from elemental to bond mapping in complex nanostructures
Author(s) :
Arenal, R. [Auteur]
Laboratoire d'étude des microstructures [Châtillon] [LEM - ONERA - CNRS]
de la Peña, Francisco [Auteur]
Unité Matériaux et Transformations - UMR 8207 [UMET]
Stéphan, O. [Auteur]
Laboratoire de Physique des Solides [LPS]
Walls, M. [Auteur]
Laboratoire de Physique des Solides [LPS]
Tencé, M. [Auteur]
Laboratoire de Physique des Solides [LPS]
Loiseau, A. [Auteur]
Laboratoire d'étude des microstructures [Châtillon] [LEM - ONERA - CNRS]
Colliex, C. [Auteur]
Laboratoire de Physique des Solides [LPS]
Laboratoire d'étude des microstructures [Châtillon] [LEM - ONERA - CNRS]
de la Peña, Francisco [Auteur]
Unité Matériaux et Transformations - UMR 8207 [UMET]
Stéphan, O. [Auteur]
Laboratoire de Physique des Solides [LPS]
Walls, M. [Auteur]
Laboratoire de Physique des Solides [LPS]
Tencé, M. [Auteur]
Laboratoire de Physique des Solides [LPS]
Loiseau, A. [Auteur]
Laboratoire d'étude des microstructures [Châtillon] [LEM - ONERA - CNRS]
Colliex, C. [Auteur]
Laboratoire de Physique des Solides [LPS]
Journal title :
Ultramicroscopy
Abbreviated title :
Ultramicroscopy
Volume number :
109
Pages :
32-38
Publisher :
Elsevier BV
Publication date :
2008-12
ISSN :
0304-3991
HAL domain(s) :
Chimie/Matériaux
Physique [physics]/Matière Condensée [cond-mat]/Science des matériaux [cond-mat.mtrl-sci]
Physique [physics]/Physique [physics]/Géophysique [physics.geo-ph]
Physique [physics]/Astrophysique [astro-ph]
Planète et Univers [physics]/Astrophysique [astro-ph]
Planète et Univers [physics]/Sciences de la Terre
Physique [physics]/Matière Condensée [cond-mat]/Science des matériaux [cond-mat.mtrl-sci]
Physique [physics]/Physique [physics]/Géophysique [physics.geo-ph]
Physique [physics]/Astrophysique [astro-ph]
Planète et Univers [physics]/Astrophysique [astro-ph]
Planète et Univers [physics]/Sciences de la Terre
English abstract : [en]
Multiple least squares fitting has been employed for long time in elemental electron energy-loss spectroscopy (EELS) analysis, in particular in biology, but with the hypothesis of a rather stable shape for the used core-loss ...
Show more >Multiple least squares fitting has been employed for long time in elemental electron energy-loss spectroscopy (EELS) analysis, in particular in biology, but with the hypothesis of a rather stable shape for the used core-loss signals. In the present case, we explore its use for identifying the variations in the edges’ fine structures in complex boron nitride samples and in particular for mapping the bonding types of boron in such samples. Details about this improved procedure applied to data acquired in the spectrum-imaging mode are reported here.Show less >
Show more >Multiple least squares fitting has been employed for long time in elemental electron energy-loss spectroscopy (EELS) analysis, in particular in biology, but with the hypothesis of a rather stable shape for the used core-loss signals. In the present case, we explore its use for identifying the variations in the edges’ fine structures in complex boron nitride samples and in particular for mapping the bonding types of boron in such samples. Details about this improved procedure applied to data acquired in the spectrum-imaging mode are reported here.Show less >
Language :
Anglais
Audience :
Internationale
Popular science :
Non
Administrative institution(s) :
Université de Lille
CNRS
INRAE
ENSCL
CNRS
INRAE
ENSCL
Collections :
Research team(s) :
Matériaux Terrestres et Planétaires
Submission date :
2024-02-01T14:13:27Z
2024-02-02T10:25:21Z
2024-02-02T10:25:21Z