fmax = 800 GHz with 75 nm gate length and ...
Document type :
Autre communication scientifique (congrès sans actes - poster - séminaire...)
Title :
fmax = 800 GHz with 75 nm gate length and asymmetric gate recess forInGaAs/InAlAs PHEMT
Author(s) :
Samnouni, M. [Auteur]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Wichmann, Nicolas [Auteur]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Wallart, Xavier [Auteur]
EPItaxie et PHYsique des hétérostructures - IEMN [EPIPHY - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Coinon, Christophe [Auteur]
Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Lepilliet, sl [Auteur]
Plateforme de Caractérisation Multi-Physiques - IEMN [PCMP - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Bollaert, Sylvain [Auteur]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Wichmann, Nicolas [Auteur]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Wallart, Xavier [Auteur]
EPItaxie et PHYsique des hétérostructures - IEMN [EPIPHY - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Coinon, Christophe [Auteur]
Centrale de Micro Nano Fabrication - IEMN [CMNF - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Lepilliet, sl [Auteur]
Plateforme de Caractérisation Multi-Physiques - IEMN [PCMP - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Bollaert, Sylvain [Auteur]
Advanced NanOmeter DEvices - IEMN [ANODE - IEMN]
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 [IEMN]
Conference title :
Compound Semiconductor Week 2019, CSW 2019
City :
Nara Japan
Country :
Japon
Start date of the conference :
2019-05-19
HAL domain(s) :
Sciences de l'ingénieur [physics]
English abstract : [en]
In This paper, we present a high maximumfrequency of oscillation (fmax) and a current-gain cutoff frequency(fT) of 800 GHz and 260 GHz respectively with pseudomorphichigh-electron mobility transistor (PHEMT), using a ...
Show more >In This paper, we present a high maximumfrequency of oscillation (fmax) and a current-gain cutoff frequency(fT) of 800 GHz and 260 GHz respectively with pseudomorphichigh-electron mobility transistor (PHEMT), using a composite,InGaAs/InAs/InGaAs channel and an asymmetric gate recess.This result was achieved with long gate length LG = 75 nm. Thenoise performance has been explored until 110 GHz, and gives aminimum noise figure NFmin = 0.8 dB (1.8 dB) with associated gainGass = 16 dB (11.6 dB) at 40 GHz (94 GHz). Moreover extendingthe drain recess length to 225 nm and reducing the gate to sourcedistance by 200 nm allows a fmax = 1.2 THz.Show less >
Show more >In This paper, we present a high maximumfrequency of oscillation (fmax) and a current-gain cutoff frequency(fT) of 800 GHz and 260 GHz respectively with pseudomorphichigh-electron mobility transistor (PHEMT), using a composite,InGaAs/InAs/InGaAs channel and an asymmetric gate recess.This result was achieved with long gate length LG = 75 nm. Thenoise performance has been explored until 110 GHz, and gives aminimum noise figure NFmin = 0.8 dB (1.8 dB) with associated gainGass = 16 dB (11.6 dB) at 40 GHz (94 GHz). Moreover extendingthe drain recess length to 225 nm and reducing the gate to sourcedistance by 200 nm allows a fmax = 1.2 THz.Show less >
Language :
Anglais
Peer reviewed article :
Oui
Audience :
Internationale
Popular science :
Non
Source :