Title :

Alternator Rotor Inter-turn Short-Circuit Identification using FEM Based Learning

Author(s) :

Bacchus, Alexandre [Auteur]
Centre de Recherche en Informatique, Signal et Automatique de Lille - UMR 9189 [CRIStAL]
Laboratoire d’Électrotechnique et d’Électronique de Puissance - ULR 2697 [L2EP]
Biet, Melisande [Auteur]
Laboratoire d’Électrotechnique et d’Électronique de Puissance - ULR 2697 [L2EP]
Macaire, Ludovic [Auteur]
Centre de Recherche en Informatique, Signal et Automatique de Lille - UMR 9189 [CRIStAL]
LAGIS-SI
Tounzi, Abdelmounaim [Auteur]
Laboratoire d’Électrotechnique et d’Électronique de Puissance - ULR 2697 [L2EP]
Menach, Yvonnick Le [Auteur]
Laboratoire d’Électrotechnique et d’Électronique de Puissance - ULR 2697 [L2EP]

Conference title :

SAFEPROCESS 2015 - 9th \{IFAC\} Symposium on Fault Detection, Supervision and Safety for Technical Processes

City :

paris

Country :

France

Start date of the conference :

2015-09-02

Journal title :

IFAC-PapersOnLine

English keyword(s) :

data simulation
diagnostic
Classification
synchronous machine
generator

HAL domain(s) :

Informatique [cs]

English abstract : [en]

The goal of this paper is to identify rotor inter-turn short-circuits of an alternator. The detection method is based on the analysis of a flux probe signal located in the air gap of the machine. Previous works have shown ...
Show more >The goal of this paper is to identify rotor inter-turn short-circuits of an alternator. The detection method is based on the analysis of a flux probe signal located in the air gap of the machine. Previous works have shown that pattern recognition can be applied to detect such a fault by using the experimental data as prototypes. A new method is developed here by considering a learning step based on simulation. Therefore the machine is modeled and validated in that purpose. A feature selection is made by considering feature correlation and disparity. Finally, k nearest neighbors is used to classified experimental test data.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Centre de Recherche en Informatique, Signal et Automatique de Lille (CRIStAL) - UMR 9189

Source :

Harvested from HAL