Title :

On Mode Discernibility and Switching Detectability for Linear Switching Systems using a Data-based Projection Method

Author(s) :

Hakem, Assia [Auteur]
Laboratoire d'Automatique, Génie Informatique et Signal [LAGIS]
Pekpe, Midzodzi [Auteur]
Systèmes Tolérants aux Fautes [STF]
Cocquempot, Vincent [Auteur]
Systèmes Tolérants aux Fautes [STF]

Conference title :

23rd Chinese Control and Decision Conference, IEEE CCDC

City :

Mianyang

Country :

Chine

Start date of the conference :

2011-05-23

Book title :

Control and Decision Conference (CCDC), 2011 Chinese

Publication date :

2011-05-23

English keyword(s) :

Switching systems
data driven methods
fault detectability
mode discernibility

HAL domain(s) :

Sciences de l'ingénieur [physics]/Automatique / Robotique

English abstract : [en]

This paper addresses the problem of Fault Detection and Isolation (FDI) of switching systems where faulty behaviours are represented as faulty modes. The objectives of the on-line FDI are to identify accurately the current ...
Show more >This paper addresses the problem of Fault Detection and Isolation (FDI) of switching systems where faulty behaviours are represented as faulty modes. The objectives of the on-line FDI are to identify accurately the current mode and to estimate precisely the switching time. A data-based method is considered here to generate residuals that will be used for FDI. The discernibility condition between modes is established. It is claimed in the literature that discernibility conditions are necessary for switching detection. However, it is shown in this paper that the switching may be detected with the proposed residuals even if the modes are not discernible. Detectability conditions between modes are established and are shown to be different from discernibility ones. A simulation example is provided to illustrate this important result.Show less >

Language :

Anglais

Peer reviewed article :

Oui

Audience :

Internationale

Popular science :

Non

Collections :

• Centre de Recherche en Informatique, Signal et Automatique de Lille (CRIStAL) - UMR 9189

Source :

Harvested from HAL